Verification and Performance Tests - 2
- | + | +S | |
NOTE: Connector |
|
|
|
is removable |
|
|
|
+ | 50VDC | TO | |
- |
|
|
|
-
DVM, Scope, or RMS voltmeter (for CV tests) +
SENSE
Local
Remote
Set to Remote
- | + | +S | SENSE | ||
Local | |||||
|
|
|
| ||
|
|
|
| Remote | |
+ | 50VDC MAX TO |
| |||
- |
|
|
|
|
Set to
|
| Remote | |
DC | - | ||
| |||
| Load | ||
Ampmeter |
| resistor | |
| 400 ohm | ||
|
|
+
DVM or
-
B.
RMS voltmeter
(for CC tests) +
Current monitor
-+
- + | +S | SENSE | ||
Local | ||||
|
|
| ||
|
|
| Remote | |
+ | 50VDC MAX TO |
| ||
- |
|
| Set to | |
|
|
|
Remote
Electronic
Load (see note)
Note: Use dc supply with same polarity
connectons for - CC tests. Replace electronic load with resistors
for CC noise test.
-
DC
Ampmeter
+
Load resistor
400 ohm
-+
External
DC supply
A.
C.
Figure 2-1. Test Setup
Electronic Load
Many of the test procedures require the use of a variable load capable of dissipating the required power. If a variable resistor is used, switches should be used to either; connect, disconnect, or short the load resistor. For most tests, an electronic load can be used. The electronic load is considerably easier to use than load resistors, but it may not be fast enough to test transient recovery time and may be too noisy for the noise (PARD) tests.
Fixed load resistors may be used in place of a variable load, with minor changes to the test procedures. Also, if computer controlled test setups are used, the relatively slow (compared to computers and system voltmeters) settling times and slew rates of the power supply may have to be taken into account. "Wait" statements can be used in the test program if the test system is faster than the supply.
13