Programming Reference

Agilent 81101A SCPI Command Summary

 

 

 

see

Command

Parameter

Description

page

 

 

 

 

:DOUBle[1]

 

 

 

[:STATe]

OFFON

Enable/disable double pulses per pulse

59

 

 

period

 

:DELay

<value>

Set/read delay between double pulses

60

:HOLD

TIMEPRATio

Hold absolute delayphase delay fixed

61

 

 

with varying frequency

 

:UNIT

SSECPCT

Set/read delay units

61

:HOLD[1]

WIDThDCYCleTDELay

Hold WidthDuty cycleTrailing edge de-

62

 

 

lay fixed with varying frequency

 

:PERiod

<value>

Set/read pulse period

62

:AUTO

ONCE

Measure pulse period at CLK-IN

63

:TDELay[1]

<value>

Set/read trailing edge delay

63

:TRANsition[1]

 

 

 

:HOLD

TIMEWRATio

Hold absolute transitionstransitions as

64

 

 

width ratio fixed with varying width per

 

 

 

period

 

:UNIT

SSECPCT

Set/read transition time units

65

[:LEADing]

<value>

Set/read leading edge transition

65

:TRAiling

<value>

Set/read trailing edge transition

66

:AUTO

OFFONONCE

Couple trailing edge to leading edge

67

:TRIGger[1]

 

 

 

:VOLTage

TTLECL

Set/read TRIGGERSTROBE OUTput

67

 

 

levels

 

:WIDTh[1]

<value>

Set/read channel pulse width

68

[:SOURce]

 

 

 

:ROSCillator

 

 

 

:SOURce

INTernalEXTernal

Set/read PLL reference source

68

:EXTernal

 

 

 

:FREQuency

<value>

Set/read frequency of external PLL

69

 

 

reference

 

:VOLTage[1]

 

 

 

[:LEVel]

 

 

 

[:IMMediate]

 

 

 

[:AMPlitude]

<value>

Set/read channel amplitude voltage

70

 

 

 

 

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Image 28
Agilent Technologies 81101A manual DOUBle1 STATe

81101A specifications

Agilent Technologies 81101A is a high-performance pulse generator designed to meet the rigorous demands of today's electronic testing environments. This versatile instrument is crucial for engineers and researchers who require precise timing characteristics and reliability for their testing applications.

One of the standout features of the 81101A is its ability to generate fast, precise pulses with rise and fall times of less than 1 ns. This capability makes it ideal for testing high-speed digital circuits, as it can accurately simulate signal behavior in real-world conditions. The generator operates across a frequency range of DC to 1 GHz, allowing it to cater to a variety of applications, including telecommunications, semiconductor testing, and signal integrity investigations.

The 81101A is equipped with advanced modulation capabilities, including amplitude modulation, frequency modulation, and pulse-width modulation. These features enable users to create complex waveforms that can mimic real-world signals. Additionally, the generator supports dual-channel operation, allowing simultaneous pulse generation on two outputs, which is particularly useful for testing differential signaling schemes.

Another significant characteristic of the 81101A is its comprehensive range of output formats. It supports single-ended and differential outputs, which can be essential for measuring the performance of various devices under different operating conditions. The instrument also offers a wide range of output amplitudes, from a few millivolts to several volts, making it flexible enough to cater to a variety of testing requirements.

The user interface of the 81101A is intuitive, featuring a large graphical display that simplifies waveform configuration and real-time monitoring. This interface allows engineers to easily set parameters and visualize pulse characteristics, reducing the time required for setup and configuration.

In terms of connectivity, the 81101A is designed to integrate seamlessly into existing test environments. It includes standard interfaces such as GPIB, USB, and LAN, facilitating automated testing procedures and communication with other laboratory equipment.

Overall, the Agilent Technologies 81101A pulse generator is an essential tool for engineers seeking precise and versatile signal generation capabilities. With its high-frequency performance, advanced modulation options, and user-friendly features, it remains a valuable asset in electronic testing and research applications.