Programming Reference

SCPI Instrument Command List

SCPI Instrument Command List

The following reference sections list the instrument commands in alphabetical order. In addition to a command description, the attributes of each command are described under the following headings. Not all of these attributes are applicable to all commands. The commands are conform to the IEEE 488.2 SCPI standard.

Command

Shows the short form of the command.

Long

Shows the long form of the command.

Form

Most commands can be used in different forms:

 

Set

The command can be used to program the instrument

 

Query

The command can be used to interrogate the instru-

 

 

ment. Add a ? to the command if necessary.

 

Event

The command performs a one-off action.

Parameter

The type of parameter, if any, accepted by the command. The minimum

 

and maximum value of numeric parameters can be accessed by the

 

option MINimum or MAXimum.

Parameter Suffix

The suffixes that may follow the parameter.

Functional

Any other commands that are implicitly executed by the command.

Coupling

 

 

Value Coupling

Any other parameter that is also changed by the command.

Range Coupling

Any other parameters whose valid ranges may be changed by the

 

command.

 

*RST value

The value/state following a *RST command.

Specified Limits

The specified limits of a parameter.

Absolute Limits

Some parameters can be programmed beyond their specified limits.

Example

Example programming statements.

38

Page 38
Image 38
Agilent Technologies 81101A manual Scpi Instrument Command List

81101A specifications

Agilent Technologies 81101A is a high-performance pulse generator designed to meet the rigorous demands of today's electronic testing environments. This versatile instrument is crucial for engineers and researchers who require precise timing characteristics and reliability for their testing applications.

One of the standout features of the 81101A is its ability to generate fast, precise pulses with rise and fall times of less than 1 ns. This capability makes it ideal for testing high-speed digital circuits, as it can accurately simulate signal behavior in real-world conditions. The generator operates across a frequency range of DC to 1 GHz, allowing it to cater to a variety of applications, including telecommunications, semiconductor testing, and signal integrity investigations.

The 81101A is equipped with advanced modulation capabilities, including amplitude modulation, frequency modulation, and pulse-width modulation. These features enable users to create complex waveforms that can mimic real-world signals. Additionally, the generator supports dual-channel operation, allowing simultaneous pulse generation on two outputs, which is particularly useful for testing differential signaling schemes.

Another significant characteristic of the 81101A is its comprehensive range of output formats. It supports single-ended and differential outputs, which can be essential for measuring the performance of various devices under different operating conditions. The instrument also offers a wide range of output amplitudes, from a few millivolts to several volts, making it flexible enough to cater to a variety of testing requirements.

The user interface of the 81101A is intuitive, featuring a large graphical display that simplifies waveform configuration and real-time monitoring. This interface allows engineers to easily set parameters and visualize pulse characteristics, reducing the time required for setup and configuration.

In terms of connectivity, the 81101A is designed to integrate seamlessly into existing test environments. It includes standard interfaces such as GPIB, USB, and LAN, facilitating automated testing procedures and communication with other laboratory equipment.

Overall, the Agilent Technologies 81101A pulse generator is an essential tool for engineers seeking precise and versatile signal generation capabilities. With its high-frequency performance, advanced modulation options, and user-friendly features, it remains a valuable asset in electronic testing and research applications.