Programming Reference

SCPI Instrument Command List

Command

:MMEM:CAT?

Long

:MMEMory:CATalog?

Form

Query

Parameter

["A:"]

*RST value

Not applicable

Description

Use this command to get a listing of the contents of the currently

 

selected directory on the memory card. As there is only one memory card

 

slot, the parameter A: is optional. The information returned is:

 

<bytes_used>,<bytes_free>[,<file_entry>]

<bytes_used> <bytes_free> <file_entry>

The total number of bytes used on the memory card.

The total number of bytes still available on the memory card. String containing the name, type and size of one file: "<file_name>,<file_type>,<file_size>"

 

The <file_type> is always blank. A directory name has <file_size> = 0.

Command

:MMEM:CDIR

 

Long

:MMEMory:CDIRectory

 

Form

Event

 

Parameter

["directory_name"]

 

*RST value

Not applicable

 

Description

Use this command to change the current directory on the memory card.

 

If you don't specify a directory name parameter, the root directory is

 

selected.

 

 

Note that you cannot use DOS pathnames as directory names, you can

 

only select a directory name within the current directory.

 

Use the directory name ".." to move back to the parent directory of the

 

current directory, unless you are already in the root directory "\".

Examples

To change to different directories on the memory card:

 

:MMEM:CDIR

Select root directory

 

:MMEM:CDIR "PERFORM"

Select directory "PERFORM"

 

:MMEM:CDIR ".."

Select parent directory

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Agilent Technologies 81101A manual Mmemcat?, Mmemcdir
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81101A specifications

Agilent Technologies 81101A is a high-performance pulse generator designed to meet the rigorous demands of today's electronic testing environments. This versatile instrument is crucial for engineers and researchers who require precise timing characteristics and reliability for their testing applications.

One of the standout features of the 81101A is its ability to generate fast, precise pulses with rise and fall times of less than 1 ns. This capability makes it ideal for testing high-speed digital circuits, as it can accurately simulate signal behavior in real-world conditions. The generator operates across a frequency range of DC to 1 GHz, allowing it to cater to a variety of applications, including telecommunications, semiconductor testing, and signal integrity investigations.

The 81101A is equipped with advanced modulation capabilities, including amplitude modulation, frequency modulation, and pulse-width modulation. These features enable users to create complex waveforms that can mimic real-world signals. Additionally, the generator supports dual-channel operation, allowing simultaneous pulse generation on two outputs, which is particularly useful for testing differential signaling schemes.

Another significant characteristic of the 81101A is its comprehensive range of output formats. It supports single-ended and differential outputs, which can be essential for measuring the performance of various devices under different operating conditions. The instrument also offers a wide range of output amplitudes, from a few millivolts to several volts, making it flexible enough to cater to a variety of testing requirements.

The user interface of the 81101A is intuitive, featuring a large graphical display that simplifies waveform configuration and real-time monitoring. This interface allows engineers to easily set parameters and visualize pulse characteristics, reducing the time required for setup and configuration.

In terms of connectivity, the 81101A is designed to integrate seamlessly into existing test environments. It includes standard interfaces such as GPIB, USB, and LAN, facilitating automated testing procedures and communication with other laboratory equipment.

Overall, the Agilent Technologies 81101A pulse generator is an essential tool for engineers seeking precise and versatile signal generation capabilities. With its high-frequency performance, advanced modulation options, and user-friendly features, it remains a valuable asset in electronic testing and research applications.
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