Programming Reference

SCPI Instrument Command List

Command

:SYST:CHEC

Long

:SYSTem:CHECk[:ALL][:STATe]

Form

Set & Query

Parameter

OFF ON

*RST value

ON

Description

Use this command to switch the instrument’s error checking on or off.

 

Switch off the error checking if you want to improve the programming

 

speed of the instrument, but remember that no invalid parameter or

 

mode settings will be detected and reported. Error checking is switched

 

off by the *RST command, or when default setting is invoked.

 

Error checking cannot be switched on from the front panel. Error

CAUTION

 

checking is not automatically re-enabled if you switch the instrument off

 

and on again. Therefore your test programs should send either *RST or

 

set default setting before ending.

 

 

Command

:SYST:ERR?

 

Long

:SYSTem:ERRor?

 

Form

Query

 

*RST value

Not Applicable

 

Description

Use this command to read the instrument error queue. The instrument

 

error queue can store up to 30 error codes on a first-in-first-out basis.

 

When you read the error queue, the error number and associated

 

message are put into the instrument’s output buffer.

 

If the queue is empty, the value 0 is returned, meaning NO ERROR. If the

 

queue overflows at any time, the last error code is discarded and

 

replaced with –350 meaning QUEUE OVERFLOW.

Example

To read the error queue:

 

 

:SYS:ERR?

Query for errors

Example Error

–222 "Data out of range" overlap at output 1: Width>Double

String

Delay

 

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Agilent Technologies 81101A manual Systchec, Systerr?
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81101A specifications

Agilent Technologies 81101A is a high-performance pulse generator designed to meet the rigorous demands of today's electronic testing environments. This versatile instrument is crucial for engineers and researchers who require precise timing characteristics and reliability for their testing applications.

One of the standout features of the 81101A is its ability to generate fast, precise pulses with rise and fall times of less than 1 ns. This capability makes it ideal for testing high-speed digital circuits, as it can accurately simulate signal behavior in real-world conditions. The generator operates across a frequency range of DC to 1 GHz, allowing it to cater to a variety of applications, including telecommunications, semiconductor testing, and signal integrity investigations.

The 81101A is equipped with advanced modulation capabilities, including amplitude modulation, frequency modulation, and pulse-width modulation. These features enable users to create complex waveforms that can mimic real-world signals. Additionally, the generator supports dual-channel operation, allowing simultaneous pulse generation on two outputs, which is particularly useful for testing differential signaling schemes.

Another significant characteristic of the 81101A is its comprehensive range of output formats. It supports single-ended and differential outputs, which can be essential for measuring the performance of various devices under different operating conditions. The instrument also offers a wide range of output amplitudes, from a few millivolts to several volts, making it flexible enough to cater to a variety of testing requirements.

The user interface of the 81101A is intuitive, featuring a large graphical display that simplifies waveform configuration and real-time monitoring. This interface allows engineers to easily set parameters and visualize pulse characteristics, reducing the time required for setup and configuration.

In terms of connectivity, the 81101A is designed to integrate seamlessly into existing test environments. It includes standard interfaces such as GPIB, USB, and LAN, facilitating automated testing procedures and communication with other laboratory equipment.

Overall, the Agilent Technologies 81101A pulse generator is an essential tool for engineers seeking precise and versatile signal generation capabilities. With its high-frequency performance, advanced modulation options, and user-friendly features, it remains a valuable asset in electronic testing and research applications.
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