Agilent Technologies 85054-90049 Gaging Connectors

3-6 85054B

Use, Maintenance, and Care of the Devices

Gaging Connectors

The ga ges available from Agilent Technologies are intended for preventive maintenance

and troubleshooting purposes only. (See Tabl e 6-1 o n page 6-2 fo r part num be r

infor mation.) They are effective in detecting excessive center conductor protrusion or

reces sion, and conductor damage on DUTs, test acc essories , and the c alibration kit devices .

Do no t u se th e gag es fo r precis e pin d epth meas u rements.

The connector gages are only cap able of performing coarse measurements. They do not

provid e the degr ee of accuracy necessary to precisely measure the pin depth of the kit

devic es. Thi s is partial ly due to the repeatabi lity unce rtainties that a re associated with t he

measurement. Only the factory—through specia l gaging processes and electrical testing—

can accurately verify the mechanical characteristic s of the devices.

Wi th proper te chnique , however, the g ages are useful in det ecting gross pin depth err ors on

device connectors. To achieve maximum accuracy, random errors must be reduced by

taking the average of at least three measurements having different gage orientations on

the connector. Even the resultant average ca n be in error by as much as ± 0.0 001 inch du e

to systematic (biasing) error s usually resulting from worn gages and gage masters. The

info rmatio n in Tab le 2-2 on pa ge 2-4 assumes new gages and gage masters. Therefore,

these systematic errors were not included in the uncer tainty analysis. As the gages

undergo mor e use, the systematic errors can bec ome more signific ant in the a ccuracy of the

measurement.

The measurement uncerta inties (see Tabl e 2-2 on page 2-4) are primarily a function of the

assem b ly materials and design, and the uniq ue inter action each device type has with the

gage. Therefore, these uncertainties can vary among the different devices. For examp le,

note the difference between the uncertainties of the opens and shorts in Table 2-2.

The observed pin depth limits in Table 2-2 add these uncertainties to the typical factory

pin dep th values to provide practical limits that can be referenced when using the ga ges.

See “Pin Depth” on page 2-3. Refer to “Kit Contents” on page 1-2 for more information on

the des ign of the calibration devices in this kit.

NOTE When measuring p in depth, the measured value (resultant average of three

or more measurements) is not the true value. Always compare the measured

value with the obser ved pin d epth lim its in Table 2-2 on page 2-4 to evaluate

the condition of device connectors.