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Data Retention and Endurance |
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Parameter |
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| Description | Min |
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DATAR |
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| Data Retention | 20 |
| Years |
NVC |
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| Nonvolatile STORE Operations | 200 |
| K |
Capacitance
These parameters are guaranteed but not tested.
Parameter | Description | Test Conditions | Max | Unit |
CIN | Input Capacitance | TA = 25°C, f = 1 MHz, | 7 | pF |
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| VCC = 0 to 3.0 V |
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COUT | Output Capacitance | 7 | pF |
Thermal Resistance
These parameters are guaranteed but not tested.
Parameter | Description | Test Conditions |
| Unit |
ΘJA | Thermal Resistance | Test conditions follow standard test methods | 34.85 | °C/W |
| (junction to ambient) | and procedures for measuring thermal |
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| impedance, in accordance with EIA/JESD51. |
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ΘJC | Thermal Resistance | 16.35 | °C/W | |
| (junction to case) |
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| Figure 7. AC Test Loads |
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R1 577Ω
3.0V |
OUTPUT |
30 pF
R1 577Ω
3.0V |
OUTPUT |
R2 | 5 pF |
789Ω
For
R2
789Ω
AC Test Conditions
Input Pulse Levels | 0 V to 3 | V |
Input Rise and Fall Times (10% - 90%) | <5 ns | |
Input and Output Timing Reference Levels | 1.5 | V |
Document Number: | Page 16 of 28 |
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