CY7C1292DV18CY7C1294DV18
Document #: 001-00350 Rev. *A Page 18 of 23
Note:
22.Unless otherwise noted, test conditions assume signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250, VDDQ = 1.5V, input
pulse levels of 0.25V to 1.25V, and output loading of the specified IOL/IOH and load capacitance shown in (a) of AC Test Loads.
Thermal Resistance[21]

Parameter Description Test Conditions 165 FBGA Unit

ΘJA Thermal Resistance (Junction to Ambient) Test conditions follow standard test

methods and procedures for measuring

thermal impedance, per EIA/JESD51.

28.51 °C/W

ΘJC Thermal Resistance (Junction to Case) 5.91 °C/W

AC Test Loads and Waveforms

1.25V
0.25V
R = 50
5pF
ALL INPUT PULSES
Device RL= 50
Z0= 50
VREF = 0.75V
VREF = 0.75V
[22]
0.75V
Under
Test
0.75V
Device
Under
Test
OUTPUT
0.75V
VREF
VREF
OUTPUT

ZQ

ZQ

(a)
Slew Rate = 2 V/ns
RQ =
250
(b)
RQ =
250
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