CY7C1386D, CY7C1386FCY7C1387D, CY7C1387F
Document Number: 38-05545 Rev. *E Page 13 of 30
the TAP controller, it will directly control the state of the output
(Q-bus) pins, when the EXTEST is entered as the current
instruction. When HIGH, it will enable the output buffers to
drive the output bus. When LOW, this bit will place the output
bus into a High-Z condition.
This bit can be set by entering the SAMPLE/PRELOAD or
EXTEST command, and then shifting the desired bit into that
cell, during the Shift-DR state. During Update-DR, the value
loaded into that shift-register cell will latch into the preload
register. When the EXTEST instruction is entered, this bit will
directly control the output Q-bus pins. Note that this bit is
preset HIGH to enable the output when the device is powered
up, and also when the TAP controller is in the Test-Logic-Reset
state.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.

TAP Ti min g

TAP AC Switching Characteristics

Over the Operating Range [10, 11]
Parameter Description Min Max Unit
Clock
tTCYC TCK Clock Cycle Time 50 ns
tTF TCK Clock Frequency 20 MHz
tTH TCK Clock HIGH time 20 ns
tTL TCK Clock LOW time 20 ns
Output Times
tTDOV TCK Clock LOW to TDO Valid 10 ns
tTDOX TCK Clock LOW to TDO Invalid 0 ns
Set-up Times
tTMSS TMS Set-up to TCK Clock Rise 5 ns
tTDIS TDI Set-up to TCK Clock Rise 5 ns
tCS Capture Set-up to TCK Rise 5 ns
Hold Times
tTMSH TMS Hold after TCK Clock Rise 5 ns
tTDIH TDI Hold after Clock Rise 5 ns
tCH Capture Hold after Clock Rise 5 ns
tTL
Test Clock
(TCK)
123456
Test Mode Select
(TMS)
tTH
Test Data-Out
(TDO)
tCYC
Test Data-In
(TDI)
tTMSH
tTMSS
tTDIH
tTDIS
tTDOX
tTDOV
DON’T CARE UNDEFINED
Notes
10.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
11.Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns.
[+] Feedback