CY7C1470BV25
CY7C1472BV25, CY7C1474BV25
Document #: 001-15032 Rev. *D Page 19 of 29
Maximum Ratings
Exceeding maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied............................................ –55°C to +125°C
Supply Voltage on VDD Relative to GND........–0.5V to +3.6V
Supply Voltage on VDDQ Relative to GND.......–0.5V to +VDD
DC to Outputs in Tri-State....................–0.5V to VDDQ + 0.5V
DC Input Voltage...................................–0.5V to VDD + 0.5V
Current into Outputs (LOW)........................................ 20 mA
Static Discharge Voltage.......................................... > 2001V
(MIL-STD-883, Method 3015)
Latch up Current.................................................... > 200 mA
Operating Range
Range Ambient
Tempe ratur e VDD VDDQ
Commercial 0°C to +70°C 2.5V –5%/+5% 2.5V–5% to
VDD
Industrial –40°C to +85°C
Electrical Characteristics
Over the Operating Range[12, 13]
Parameter Description Test Conditions Min Max Unit
VDD Power Supply Voltage 2.375 2.625 V
VDDQ IO Supply Voltage For 2.5V IO 2.375 VDD V
VOH Output HIGH Voltage For 2.5V IO, IOH=1.0 mA 2.0 V
VOL Output LOW Voltage For 2.5V IO, IOL= 1.0 mA 0.4 V
VIH Input HIGH Voltage[12] For 2.5V IO 1.7 VDD + 0.3V V
VIL Input LOW Voltage[12] For 2.5V IO –0.3 0.7 V
IXInput Leakage Current
except ZZ and MODE GND VI VDDQ –5 5μA
Input Current of MODE Input = VSS –30 μA
Input = VDD 5μA
Input Current of ZZ Input = VSS –5 μA
Input = VDD 30 μA
IOZ Output Leakage Current GND VI VDDQ, Output Disabled –5 5μA
IDD [14] VDD Operating Supply VDD = Max, IOUT = 0 mA,
f = fMAX = 1/tCYC
4.0-ns cycle, 250 MHz 450 mA
450 mA5.0-ns cycle, 200 MHz
6.0-ns cycle, 167 MHz 400 mA
ISB1 Automatic CE
Power Down
Current—TTL Inputs
Max. VDD, Device Deselected,
VIN VIH or VIN VIL,
f = fMAX = 1/tCYC
4.0-ns cycle, 250MHz 200 mA
5.0-ns cycle, 200 MHz 200 mA
6.0-ns cycle, 167 MHz 200 mA
ISB2 Automatic CE
Power Down
Current—CMOS Inputs
Max. VDD, Device Deselected,
VIN 0.3V or
VIN > VDDQ 0.3V, f = 0
All speed grades 120 mA
Notes
12.Overshoot: VIH(AC) < VDD +1.5V (pulse width less than tCYC/2). Undershoot: VIL(AC)> –2V (pulse width less than tCYC/2).
13.TPower-up: assumes a linear ramp from 0V to VDD (min.) within 200 ms. During this time VIH < VDD and VDDQ < VDD.
14.The operation current is calculated with 50% read cycle and 50% write cycle.
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