Cypress CY7C1470BV25, CY7C1472BV25, CY7C1474BV25 Switching Characteristics

CY7C1470BV25
CY7C1472BV25, CY7C1474BV25
Document #: 001-15032 Rev. *D Page 21 of 29
Switching Characteristics
Over the Operating Range. Timing reference is 1.25V when VDDQ = 2.5V. Test conditions shown in (a) of “AC Test Loads and
Waveforms” on page20 unless otherwise noted.
Parameter Description –250 –200 –167 Unit
Min Max Min Max Min Max
tPower[15] VCC (typical) to the First Access Read or Write 1 1 1 ms
Clock
tCYC Clock Cycle Time 4.0 5.0 6.0 ns
FMAX Maximum Operating Frequency 250 200 167 MHz
tCH Clock HIGH 2.0 2.0 2.2 ns
tCL Clock LOW 2.0 2.0 2.2 ns
Output Times
tCO Data Output Valid After CLK Rise 3.0 3.0 3.4 ns
tOEV OE LOW to Output Valid 3.0 3.0 3.4 ns
tDOH Data Output Hold After CLK Rise 1.3 1.3 1.5 ns
tCHZ Clock to High-Z[16, 17, 18] 3.0 3.0 3.4 ns
tCLZ Clock to Low-Z[16, 17, 18] 1.3 1.3 1.5 ns
tEOHZ OE HIGH to Output High-Z[16, 17, 18] 3.0 3.0 3.4 ns
tEOLZ OE LOW to Output Low-Z[16, 17, 18] 000ns
Setup Times
tAS Address Setup Before CLK Rise 1.4 1.4 1.5 ns
tDS Data Input Setup Before CLK Rise 1.4 1.4 1.5 ns
tCENS CEN Setup Before CLK Rise 1.4 1.4 1.5 ns
tWES WE, BWx Setup Before CLK Rise 1.4 1.4 1.5 ns
tALS ADV/LD Setup Before CLK Rise 1.4 1.4 1.5 ns
tCES Chip Select Setup 1.4 1.4 1.5 ns
Hold Times
tAH Address Hold After CLK Rise 0.4 0.4 0.5 ns
tDH Data Input Hold After CLK Rise 0.4 0.4 0.5 ns
tCENH CEN Hold After CLK Rise 0.4 0.4 0.5 ns
tWEH WE, BWx Hold After CLK Rise 0.4 0.4 0.5 ns
tALH ADV/LD Hold after CLK Rise 0.4 0.4 0.5 ns
tCEH Chip Select Hold After CLK Rise 0.4 0.4 0.5 ns
Notes
15.This part has a voltage regulator internally; tpower is the time power is supplied above VDD minimum initially, before a read or write operation can be initiated.
16.tCHZ, tCLZ, tEOLZ, and tEOHZ are specified with AC test conditions shown in (b) of “AC Test Loads and Waveforms” on page20. Transition is measured ±200 mV from
steady-state voltage.
17.At any supplied voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data
bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve
High-Z before Low-Z under the same system conditions.
18.This parameter is sampled and not 100% tested.
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