This tests the external link connection. For the fiber medium, this is simply another external loopback test. For the copper medium, this is not applicable.

Group B: Memory tests

Various patterns (0x55aa55aa, 0xaa55aa55, & address) are used to test each of the memory blocks.

B1. TXP scratchpad

B2. TPAT scratchpad

B3. RXP scratchpad

B4. COM scratchpad

B5. CP scratchpad

B6. MCP scratchpad

B7. TAS header buffer

B8. TAS payload buffer

B9. RBUF via GRC

B10. RBUF via indirect access

B11. RBUF Cluster list

B12. TSCH list

B13. CSCH List

B14. RV2P scratchpads

B15. TBDC memory

B16. RBDC memory

B17. CTX page table

B18. CTX memory

Group C: Block tests

C1. CPU logic and DMA interface tests

The tests check the basic logic functionalities of each of the on-chip CPUs. The tests also cover the DMA interface exposed to the CPUs. These tests require the presence of a test firmware file inside the “diagfw” directory.

C2. RBUF allocation test

This tests the Rx buffer allocation interface.

C3. CAM access test

This tests read, write, add, modify, and cache hit functionalities of the associative memory.

C4. TPAT cracker test

This tests the packet cracking logic block as well as the checksum/CRC offload logic. This test requires the presence of a test firmware file inside the “diagfw” directory.

C5. FIO register test

This is another register test dedicated for register interface only exposed to the internal CPUs. This test requires the presence of the test firmware files in the “diagfw” directory.

Diagnostics 54

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HP 441877-00F manual Diagnostics