N
network analyzer compatibility matrix, 1-8 normalizing parameters, viewing, 3-11
O
operation precautions, 1-13 operation verification, 1-5 option descriptions, 1-4
options for service and support, 1-9 ordering information, 7-2
O-ring replacement, 2-6,6-10
P
parts ID, front panel, 7-19
parts ID, instrument chassis, 7-35 parts ID, internal top view, 7-24 parts ID, major assemblies, 7-15 parts ID, motherboard, 7-25 parts ID, rear panel, 7-21
parts ID, test port components, 7-20 parts ID, unique to option 002, 7-27
parts ID, unique to option 002 "plus" 007, 7-33 parts ID, unique to option 004, 7-30
parts ID, unique to option 004 "plus" 007, 7-34 parts ID, unique to option 007, 7-31
phase lock, 4-2phone-ordering parts, 7-2 physical characteristics, 4-2 plug assembly part numbers, 7-11 port attenuators replacement, 6-11
post-regulator board replacement, 6-13 power level input limits, 1-13
power requirements, 4-2
power transformer replacement, 6-9 powering up, 3-5
R
racking the test set, 2-4
R-E (rebuilt exchange assemblies) defined, 7-1R-E process, 7-13
rear panel RF connector, 4-2rear-panel parts ID, 7-21
reference channel phase lock power level, 4-2 reference designation, major assemblies, 7-14 reference designator abbreviations, 7-2 regulator board replacement, 6-6 replacement procedure basics, 6-5
revision information, 1-8 RF input damage level, 4-2
S
safety precautions, 1-13
sales and service internet address, vi sales and service office locations, vi selecting a test set, 3-5
serial prefix location and description, 1-7 service and support options, 1-9 shipping the test set, 2-7
source compatibility matrix, 1-8 static discharge precautions, 6-1 storage temperature, 2-2 switch/splitter replacement, 6-5switch-driver control, 3-6
T
temperature and humidity requirements, 2-2 test equipment model requirements, 1-12 test port attenuator modifications, 3-10 test port characteristics, 4-1
test port couplers replacement, 6-11 test set, 4-2
test set accessories identification, 2-3 test set adapters, 1-11
test set connections, for two or more, 3-5 test set options, 1-4
test set specifications, 4-1
test set switching, two test sets, 3-4 test set test-fixture kit, 1-11
test set troubleshooting, 1-5test-port connector replacement, 6-7test-port parts ID, 7-20
trace memory storage, 3-11
U
user 1 power levels for reference channel, 4-2 using bias tees, 1-2
using multiple test-set configurations, 3-5 using the test set at a bench, 2-4
V
verification kit part number, 1-10 verifying test set performance, 3-14 viewing S11 to S22 parameters, 3-12
W
what to do with damaged shipments, 2-2
