HP 8517B Test Set Description, Figure 1-1Standard HP 8517B Test Set Block Diagram

Getting Started

Test Set Description

The HP 8517B test set configured with an HP 8510B/C network analyzer and an HP 8360 series source, creates a system capable of making S-parameter measurements from 45 MHz to 50 GHz. The system is particularly suited for making two-port device measurements. You can measure all four S-parameters without physically reversing the DUT (device under test).

The system is also designed for making measurements on non-reciprocal devices or components like transistors, amplifiers or isolators where S12 measurements are required.

Two directional couplers are used for signal separation. The configuration is illustrated in the following figures:

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Figure 1-1, “Standard HP 8517B Test Set Block Diagram" Figure 1-2, “Option 004, HP 8517B Test Set Block Diagram" Figure 1-3, “Option 007, HP 8517B Test Set Block Diagram"

For active-device measurements, two bias tees apply external DC bias to both test port center conductors.

Figure 1-1 Standard HP 8517B Test Set Block Diagram

1-2HP 8517B S-Parameter Test Set Manual