Intel IXD1110 manual Reset Test Points, 8.2 IXF1110 Input Clock Test Points, GBIC Test Points

Models: IXD1110

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8.0Test Points

IXD1110 Demo Board

8.0Test Points

8.1Reset Test Points

Two test points allow evaluation of the IXF1110 reset signals. TP21 allows IXF1110 Sys_Res signal monitoring. DTP3 allows board reset signal monitoring. The board Sys_Res can be monitored on both test points if it is asserted by Switch S1 or the CPU. The reset is seen at TP21 if an IXF1110 reset is issued by the software interface.

Table 5. Intel® IXF1110 Reset Test Points

Test Point

 

Symbol

IXF1110 Ball

Description

 

Designator

 

 

 

 

 

 

 

 

 

 

 

 

 

TP21

 

 

 

 

Y4

System reset for IXF1110

Sys_Res

 

 

 

 

 

 

DTP3

 

 

 

 

Board reset

Sys_Res

 

 

 

 

 

 

 

NOTE: DTP = Differential Test Point, TP = Test Point

8.2IXF1110 Input Clock Test Points

The IXF1110 requires input clocks of 50 and 125 MHz. There are two test points that allow the user to monitor those signals (see Table 6).

Table 6. Intel® IXF1110 Differential Input Clock Test Points

Test Point

Symbol

 

IXF1110 Ball

Description

 

Designator

 

 

 

 

 

 

 

 

 

DTP1

CLK125

 

AA5

125 MHz input clock for IXF1110

 

 

 

 

 

DTP2

CLK50

 

C21

50 MHz input clock for IXF1110

 

 

 

 

 

NOTE: DTP = Differential Test Point

 

 

 

 

 

 

 

8.3GBIC Test Points

Table 7 lists GBIC test points that allow evaluation of the I2C clock, which is connected to all of the GBIC modules, and the I2C Data pins for each of the ten ports. For more information on the I2C interface, refer to the IXF1110 Datasheet.

Table 7. GBIC Test Points (Sheet 1 of 2)

Test Point

Symbol

 

IXF1110 Ball

Description

 

Designator

 

 

 

 

 

 

 

 

 

DTP6

I2C_CLK

 

L19

I2C_CLK for IXF1110

DTP7

I2C_DATA_0

 

G22

I2C_DATA_0 for IXF1110

DTP8

I2C_DATA_1

 

G23

I2C_DATA_1 for IXF1110

DTP9

I2C_DATA_2

 

J24

I2C_DATA_2 for IXF1110

DTP10

I2C_DATA_3

 

F22

I2C_DATA_3 for IXF1110

NOTE: DTP = Differential Test Point

 

 

 

 

 

 

 

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Development Kit Manual

Document Number: 250807

Revision Number: 003

Revision Date: June 27, 2003

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Intel IXD1110 manual Reset Test Points, 8.2 IXF1110 Input Clock Test Points, GBIC Test Points Sheet 1 of