Toshiba L630 Subtest 04 Walking 1’s Test, Subtest 05 Walking 0’s Test, Subtest 06 Memory Address

3.6 Memory Test 3 Diagnostic Programs

Test by using read instructions.

Subtest 04 Walking 1’s Test

The test item is to ensure that there is no short circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 05 Walking 0’s Test

The test item is to ensure that there is no open circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 06 Memory Address

This test item is to check short and open issue on memory address lines.

Subtest 07 Refresh Test

This test item is to check whether the memory refresh works normally. The parameter dialog window is as follows:

Subtest 08 Cache Memory

The test item is to check whether the CPU internal cache memory could be accessed correctly.

Subtest 09 Random Memory

Random Memory test includes the following two test items: Randomize Test and Random Incremental Read/Write Test. The parameter dialog window is the same as that in ‘Subtest 03 Extended Pattern’.

1. Randomize Test

This test item is to check whether the memory could be correctly accessed with randomized data and randomized memory address.

2. Random Increment Read/Write

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