Toshiba Satellite, M40 manual Memory Test Diagnostic Programs, Subtest 03 Extended Pattern

3.6 Memory Test 3 Diagnostic Programs

test coverage would be based on the setting and the value in ‘Percent (%) mentioned at below.

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.

Percent (%): Choose the percentage of the defined range of the memory to be tested.

Time Limit(h): Choose or Input the time (hour) of the defined range of the memory to be tested.

Time Limit(m): Choose or Input the time (minute) of the defined range of the memory to be tested.

1.Bit Stuck High Test

Data pattern: Every bit is ‘1’ (Each bit is high)

2.Bit Stuck Low Test

Data pattern: Every bit is ‘0'(Each bit is low);

3.Checker Board Test

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010 (0xA);

4.CAS Line Test

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and 1111(0xF);

5.Incremental Test

Data pattern: A series of increasing data from 0 by adding 1 each time;

6.Decrement Test

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by subtracting 1 each time;

7.Incremental / Decrement Test

Data Pattern is a series of data whose low byte is increasing data from 0x00 and high byte is decreasing data from 0xFF.

Subtest 03 Extended Pattern

Satellite M40/M45 TECRA A4 Dynabook Vx/4 Maintenance

Manual 37