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Toshiba 3006GAL, 4006GAH, MK6006GAH Byte, Read/write, Description, Selective self-testlog, 10.8.42.6.5 Selective self-testlog, 10.8.42.6.5.2 Test span definition

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10.8.42.6.5 Selective self-test log

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the content of the Selective self-test log.

Selective self-test log

Byte	Description	Read/write
0-1	Data structure revision number	R/W
2-9	Starting LBA for test span 1	R/W
10-17	Ending LBA for test span 1	R/W
18-25	Starting LBA for test span 2	R/W
26-33	Ending LBA for test span 2	R/W
34-41	Starting LBA for test span 3	R/W
42-49	Ending LBA for test span 3	R/W
50-57	Starting LBA for test span 4	R/W
58-65	Ending LBA for test span 4	R/W
66-73	Starting LBA for test span 5	R/W
74-81	Ending LBA for test span 5	R/W
82-337	Reserved	Reserved
338-491	Vendor specific	Vendor specific
492-499	Current LBA under test	Read
500-501	Current span under test	Read
502-503	Feature flags	R/W
504-507	Vendor specific	Vendor specific
508-509	Selective self-test pending time	R/W
510	Reserved	Reserved
511	Data structure checksum	R/W

10.8.42.6.5.1 Data structure revision number

The value of the data structure revision number filed shall be 01h. This value shall be written by the host and returned unmodified by the device.

10.8.42.6.5.2 Test span definition

The Selective self-test log provides for the definition of up to five test spans. The starting LBA for each test span is the LBA of the first sector tested in the test span and the ending LBA for each test span is the last LBA tested in the test span. If the starting and ending LBA values for a test span are both zero, a test span is not defined and not tested. These values shall be written by the host and returned unmodified by the device.

10.8.42.6.5.3 Current LBA under test

The Current LBA under test field shall be written with a value of zero by the host. As the self-test progresses, the device shall modify this value to contain the beginning LBA of the 65,536 sector block currently being tested. When the self-test including the off-line scan between test spans has been completed, a zero value is placed in this field.

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Contents

1.1.1.1.1.1.1.1 TOSHIBA Revision History 1.8 inch Hard Disk Drive MK6006GAH/4006GAH/3006GAL Product Specification Revision Date Initial issue ＳＡＦＥＴＹ IMPORTANT MESSAGES LIMITATION OF LIABILITY USAGE RESTRICTIONS SAFETY Page TABLE OF CONTENTS Page Page Table of Figures OWER URRENT RANSITION MK3006GAL D 1. SCOPE 2. GENERAL DESCRIPTION Page 3.KEY FEATURES 4. BASIC SPECIFICATION 5. PERFORMANCE 6. POWER REQUIREMENTS 6.1Supply Voltage 6.2 Power Consumption Figure 1 Power Current Transition 6.3 Energy Consumption Efficiency 7. MECHANICAL SPECIFICATIONS 7.1 Dimension and weight 7.2 Drive Orientation 7.3 Mounting Instructions 7.3.1 Installation Figure 2 MK3006GAL Dimensions Figure 3 MK6006GAH/MK4006GAH Dimensions 8. ENVIRONMENTAL LIMITS 8.1 Temperature and Humidity 8.1.1 Temperature 8.1.2 Humidity 8.2 Vibration Page 8.4 Altitude 8.5 Acoustics（Sound Power） 8.6 Safety Standards EMC Adaptability 8.7 Magnetic Fields 9. RELIABILITY 9.1 Error Rate 9.1.1 Non- Recoverable Error Rate 9.1.2 Seek Error Rate 9.2 Product Life 9.5 Load/Unload HOST INTERFACE 10.1 Cabling Interface Connector Cable length and capacitance DC input/output Characteristics 10.2.2.1 Input 10.2.2.2 Output 10.3 Interface connector 10.3.1 ATA interface connector 10.3.2 Pin Assignment 10.3.3 Signal Treatment 10.3.4 Series resistance 10.3.5 Signal Description I/O 10.4 Host Interface Timing 10.4.1 Program I/O Write Timing 10.4.2 Program I/O Read Timing 10.4.3 Multiword DMA Write Timing 10.4.4 Multiword DMA Read Timing 10.4.5 Ultra DMA Timing Sustained Ultra DMA data in burst Host pausing an Ultra DMA data in burst Device terminating an Ultra DMA data in burst Host terminating an Ultra DMA data in burst Initiating an Ultra DMA data out burst Sustained Ultra DMA data out burst Device pausing an Ultra DMA data out burst Host terminating an Ultra DMA data out burst Device terminating an Ultra DMA data out burst Page 10.4.6 Reset Timing 10.5 Grounding 10.6 Address Decoding 10.7 Register Description 10.7.1 Data Register 10.7.1.1 Read/Write command 10.7.1.2 Read/Write Buffer command 10.7.1.3 Format command 10.7.2 Error Register 10.7.2.1 Operational Mode 10.7.2.2 Diagnostic Mode 10.7.3 Features Register (Write Precompensation Register) 10.7.3.1 Smart command 10.7.4 Sector Count Register 10.7.4.1 Disk Access command 10.7.4.2 Initialize Device Parameters command 10.7.5 Sector Number Register 10.7.6 Cylinder Low Registers 10.7.6.1 Disk Access command 10.7.6.2 SMART commands 10.7.7 Cylinder High Registers 10.7.8 Device/Head Register 10.7.9 Status Register 10.7.10 Command Register Command Code 10.7.11 Alternate Status Register 10.7.12 Device Control Register 10.7.13 Device Address register4 10.8 Command Descriptions 10.8.1 Nop (00h) 10.8.2 Recalibrate5 (1xh) 10.8.3 Flush Cache (E7h) 10.8.4 Flush Cache EXT (EAh) 10.8.5 Read Sector 10.8.6 Read Sector EXT 10.8.7 Write Sector 10.8.8 Write Sector EXT Page 10.8.9 Read Verify (40h) 10.8.10 Read Verify EXT 10.8.11 Write Verify6 (3Ch) 10.8.12 Format Track 10.8.13 Seek (7xh) 10.8.14 Toshiba Specific 10.8.15 Execute Diagnostics (90h) 10.8.16 Initialize Device Parameters (91h) 10.8.17 Download Microcode (92h) 10.8.18 Read Multiple 10.8.19 Read Multiple EXT (29h) 10.8.20 Write Multiple 10.8.21 Write Multiple EXT (39h) 10.8.22 Set Multiple Mode (C6h) 10.8.23 Read DMA 10.8.24 Read DMA EXT 10.8.25 Write DMA (CAh/CBh) 10.8.26 Write DMA EXT 10.8.27 Power Control (Exh) 10.8.27.1 Stand-byImmediate (E0/94) 10.8.27.2 Idle Immediate (E1/95) 10.8.27.3 Stand-by(E2/96) 10.8.27.4 Idle (E3/97) 10.8.27.5 Check Power Mode (E5/98) 10.8.27.6 Sleep (E6/99) 10.8.28 Read Buffer (E4h) 10.8.29 Write Buffer 10.8.30Identify Device (ECh) Page Page Page Page Page Page Page Page Page Page Page Page Page Page 10.8.31 SET MAX (F9h) Set Max Address 10.8.31.2 Set Max Set Password 10.8.31.3 Set Max Lock 10.8.31.4 Set Max Unlock 10.8.32 SET MAX ADDRESS EXT (37h) 10.8.33 Read Native Max Address (F8h) 10.8.34 Read Native Max Address EXT (27h) 10.8.35 Set Features (EFh) 10.8.36 SECURITY SET PASSWORD (F1h) 10.8.37 SECURITY UNLOCK (F2h) 10.8.38 SECURITY ERASE PREPARE (F3h) 10.8.39 SECURITY ERASE UNIT (F4h) 10.8.40 SECURITY FREEZE LOCK (F5h) 10.8.41 SECURITY DISABLE PASSWORD 10.8.42 SMART Function Set (B0h) SMART Read Attribute values Attribute Name Value Definition Self-testexecution status values Page SMART Read Attribute thresholds 10.8.42.3 SMART Enable Disable Attribute Autosave SMART Save Attribute Values SMART Execute Off-lineImmediate 10.8.42.5.2 Captive mode 10.8.42.5.3 SMART off-lineroutine 10.8.42.5.4 SMART Short self-testroutine 10.8.42.5.5 SMART Extended self-testroutine 10.8.42.5.6 SMART Selective self-testroutine Page SMART Read Log Sector 10.8.42.6.2 Summary error log sector SMART summary error log sector 10.8.42.6.2.1 Error log version 10.8.42.6.2.2 Error log data structure Error log data structure 10.8.42.6.2.3 Command data structure Command data structure 10.8.42.6.2.4 Error data structure Error data structure State field values 10.8.42.6.2.5 Device error count 10.8.42.6.2.6 Data structure checksum 10.8.42.6.3 Comprehensive error log Comprehensive error log 10.8.42.6.3.1 Error log version 10.8.42.6.3.4 Device error count 10.8.42.6.3.5 Data structure checksum 10.8.42.6.4 Self-testlog sector Self-testlog data structure 10.8.42.6.4.1 Self-testlog data structure revision number 10.8.42.6.4.2 Self-testlog descriptor entry Self-testlog descriptor entry 10.8.42.6.4.3 Self-testindex 10.8.42.6.4.4 Data structure checksum 10.8.42.6.5 Selective self-testlog Selective self-testlog Read/write 10.8.42.6.5.1 Data structure revision number 10.8.42.6.5.2 Test span definition 10.8.42.6.5.4 Current span under test 10.8.42.6.5.5 Feature flags Selective self-testfeature flags Bit 10.8.42.6.5.6 Selective self-testpending time 10.8.42.7 SMART Write Log Sector 10.8.42.8 SMART Enable Operations SMART Disable Operations SMART Return Status 10.8.42.11 SMART Enable/Disable Automatic Off-line 10.8.43 Read Log EXT (2Fh) 10.8.43.1 General Purpose Log Directory 10.8.43.2 Extended Comprehensive SMART Error log 10.8.43.2.2 Error log index 10.8.43.2.3 Extended Error log data structure Extended Error log data structure 10.8.43.2.3.1 Command data structure Command data structure 10.8.43.2.3.2 Error data structure Error data structure Byte Descriptions State field values State 10.8.43.2.4 Device error count 10.8.43.2.5 Data structure checksum 10.8.43.3 Extended Self-testlog sector 10.8.43.3.3 Extended Self-testlog descriptor entry Extended Self-testlog descriptor entry 10.8.43.3.4 Data structure checksum 10.8.44 Write Log EXT (3Fh) 10.8.45 Device Configuration (B1h) 10.8.45.1 Device Configuration Restore Device Configuration Identify 10.8.45.3.1.1 Word 0: Data structure revision 10.8.45.3.1.2 Word 1: Multiword DMA modes supported 10.8.45.3.1.3 Word 2: Ultra DMA modes supported 10.8.45.3.1.4 Words 3-6:Maximum LBA address 10.8.45.3.1.5 Word 7: Command/features set supported 10.8.45.3.1.6Words 8-254:Reserved 10.8.45.3.1.7Word 255: Integrity word Device Configuration Set 10.8.45.4.1 Error outputs Register 10.8.45.4.2 Description 10.8.45.4.2.1 Word 0: Data structure revision 10.8.45.4.2.2 Word 1: Multiword DMA modes supported 10.8.45.4.2.3 Word 2: Ultra DMA modes supported 10.8.45.4.2.4 Words 3-6:Maximum LBA address 10.8.45.4.2.5 Word 7: Command/features set supported 10.8.45.4.2.6Words 8-254:Reserved 10.8.45.4.2.7Word 255: Integrity word 10.9 Security Mode Feature Set 10.9.1 Security mode default setting 10.9.2 Initial setting of the user password 10.9.3 Security mode operation from power-on 10.9.4 Password lost 10.9.5 Command Table 10.10 Self-Monitoring,Analysis and Reporting Technology 10.10.1Attributes 10.10.2 Attributes values 10.10.3 SMART function default setting 10.11 Adaptive Power Mode Control 10.11.1 Performance Idle 10.11.2 Active Idle 10.11.3Low Power Idle 10.11.4Transition time 10.12 Reset 10.13 Drive0/Drive1 Configuration 10.14 Cache Memory 10.14.1 Cache Operations 10.14.2 Notes for write cache 10.15 Automatic Write Reallocation 11. Protocol 11.1 PIO data in commands 11.2 PIO data out commands 11.3 Non-datacommands 11.4 DMA data transfer commands 11.5 Ultra DMA Page Page 11.6 Other timings