Agilent Technologies 1690, 1680 manual Logic Analyzer Self-Tests

Page 169

Chapter 8: Theory of Operation

Self-Tests Descriptions

Trigger Arm Test. The Trigger Arm Test verifies that the local arm signal can be received by the master acquisition IC on the acquisition board. The test also verifies the global arm signal can be driven by each acquisition IC on a master board and received by all acquisition ICs on the card. The arm lines are asserted and read at the acquisition ICs to ensure each acquisition IC recognizes the signal.

Passing the Trigger Arm Test implies any acquisition IC can arm the card and that all acquisition ICs can recognize the arm signal.

Clock Paths Test. The Clock Paths Test verifies that the system Master, Slave, and Psync clocks are functional between the acquisition ICs. The module is configured to take a simple measurement. Test data is then created at the comparators and an acquisition taken. The resulting data is then downloaded and compared with known values.

Passing the Clock Paths Test implies that all acquisition IC clock lines can be driven by each acquisition IC and can be received by each acquisition IC in the module. Consequently each acquisition IC can reliably acquire data in response to the acquisition clock signal.

Memory Modes Test. The Memory Modes Test verifies the CPU interface can properly manage the acquisition memory unload in full channel, half-channel, count only, and interleaved modes. Test data is written to acquisition memory. Different unload modes are selected, then the data is read and compared with known values.

Passing the Memory Modes Test implies that the data can be reliably read from acquisition memory in full channel, half-channel, count only, and interleaved mode. This test along with the Memory Test provides complete testing of acquisition memory downloading through the 1394 interface.

Calibration Test. The Calibration Test ensures that each acquisition IC in the module can perform an operational accuracy self-calibration. Various self- calibration routines are initiated. The results of each self-calibration routine are then checked to see if the self-calibration was successful or not.

Passing the Calibration Test implies that the module can reliably perform an operation accuracy self-calibration. Consequently the incoming data path is optimized to reduce channel-to-channel skew so the acquisition ICs can reliably capture the incoming data.

Logic Analyzer Self-Tests

Register Test. The Register Test verifies that the registers of each acquisition IC is operating properly. Test patterns are written to each register on each acquisition IC, read, and compared with know values. The registers are reset, and

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Contents Agilent Technologies 1680/90-Series Logic Analyzer Agilent 1680/90-Series Logic Analyzer-At a Glance FeaturesService Strategy This Book Contents To test the multiple-clock state acquisition Troubleshooting Theory of Operation General Information Accessories Supplied Agilent Part Number AccessoriesCharacteristics SpecificationsFull Channel Channel CountProbes Dimensions Equipment Required Recommended Test EquipmentPreparing for Use To inspect the logic analyzer Power RequirementsTo connect the 1690A,AD-series logic analyzer to a host PC To apply powerTo start the user interface To clean the logic analyzerTo test the logic analyzer Testing Performance Test Interval Materials Required Description To make the test connectorsQty To make the test connectors Set up the test equipment To set up the test equipment and the logic analyzerEquipment Required Critical Specifications Pulse Generator Setup Timebase Channel TriggerOscilloscope Setup Acquisition Display Trigger Shift ∆ Time Set up the 1680A,AD-series logic analyzerChannel Define meas To perform the logic analyzer self-tests Set up the 1690A,AD-series logic analyzerSet the reporting level Click Close to close the Analysis System Self Tests dialog To test the threshold accuracy Set up the equipmentConnect and configure the logic analyzer Test the ECL Threshold Test the 0 V User Threshold Test the next pod To set up the logic analyzer for the state mode tests To set up the logic analyzer for the state mode tests Click OK to close the Value dialog To set up the logic analyzer for the state mode tests To test the single-clock, single-edge, state acquisition Channel 1 Output Combinations Channel 2 OutputCombination Channel 2 Output Verify the test signal Setup/Hold Combinations Test Sample Position Times Window Check the setup/hold combinationTo test the single-clock, single-edge, state acquisition Following clock configurations will be used in steps 4, 5, To test the single-clock, single-edge, state acquisition Following clock configurations will be used in steps 9, 10 To test the single-clock, single-edge, state acquisition Test the next channels 1680/81A,AD and 1690/91A,AD To test the multiple-clock state acquisition 1680A, AD or 1690A, AD only 1682A, AD or 1692A, AD only Verify the test signal 2.0 ns 4.50 ns +3.0 ns To test the multiple-clock state acquisition To test the multiple-clock state acquisition Enable the pulse generator channel 1 Comp with the LED on Test the next channels 1680/81A, AD and 1690/91A, AD To test the single-clock, multiple-edge, state acquisition Modify the following pulse generator settings1680A,AD or 1690A,AD only Pod 2, channel 1682A,AD or 1692A,AD only Pod 1, channel Verify the test signal Check the setup/hold with single clock, multiple clock edges To test the single-clock, multiple-edge, state acquisition Following clock configurations will be used in steps 3, 4, To test the single-clock, multiple-edge, state acquisition Test the next channels 1680/81A,AD and 1690/91A,AD To test the time interval accuracy Function Generator Setup To test the time interval accuracy Click the Run icon to fill acquisition memory Acquire and verify the test dataTo test the time interval accuracy Performance Test Record Test Settings Results Self-TestsThreshold AccuracyEdge Acquisition Performance Test Record Settings ResultsMultiple-Clock Multiple-Edge Acquisition Time Interval Performance Test Record Settings Results Single-ClockPerformance Test Record Calibrating and Adjusting Logic analyzer calibration Troubleshooting To install the fan guard To use the flowcharts Start Troubleshooting the Agilent 1680A,AD-seriesReplace Power supply Are both instrument Yes Possible problem with LCD display, inverter, or cables Does the blue Uninstall, then reinstall Agilent Logic Analyzer application Possible problem with To test the power supply voltages To check the power-up testsPin Voltage Power Supply VoltagesTo test the LCD display signals To test disk drive voltages Equipment Required Critical SpecificationDisk Drive Voltages Pin No Signal To verify the CD-ROM Disk Drive Voltages Pin Signals Pin NoTo reinstall the operating system To recover the operating systemProblems with the Operating System Troubleshooting the Agilent 1690A,AD-series Yes Is the power cord Connected? Consult host PC Test pass? Task Manager To verify connectivity100 Device Manager101 102 To run the self-tests General Troubleshooting103 104 105 106 Acquisition board status LEDs107 To test the logic analyzer probe cables108 109 110 To check the BNC Trigger input/output signals111 On the DC source, enter a voltage setting of 3.000Digital Multimeter To test the auxiliary power005% accuracy 112113 Replacing AssembliesPrepare the instrument for disassembly 1680A,AD-series disassembly/assemblyTo remove the chassis from the sleeve 114115 To remove the acquisition board116 117 To remove the power supply118 To remove the hard disk drive119 To remove the CD-ROM drive assembly120 To remove the flexible disk drive121 122 To remove the PCI boards123 To remove the motherboard124 Transfer the I/O panel to the replacement board125 126 To remove the front panel assembly127 Reverse this procedure to install the front panel assembly128 To disassemble the front panel assembly129 To remove the distribution board130 To remove the inverter board131 To remove the fans132 To remove the cable tray133 1690A,AD-series disassembly/assembly134 To remove the fascia135 Remove the fascia away from the front panel136 137 To remove the deck138 139 140 To remove the line filter141 To remove the front panel and front frame142 143 Replaceable Parts144 Replaceable Parts OrderingSee Also Replaceable Parts List145 Exploded View Replaceable Parts Ref. Des Agilent 1680A,AD-Series Replaceable PartsExchange Assemblies 147148 0515-0372149 150 151 Front Panel Assembly152 Exploded View 154 Agilent 1690A,AD-Series Replaceable Parts155 156 157 Power Cables and Plug ConfigurationsPlug Type Cable Plug Description Length Color Country In/cm 158159 Theory of OperationBlock-Level Theory Agilent 1680A,AD-Series Logic Analyzer Block Diagram 160161 Agilent 1680A,AD-series Logic Analyzer TheoryLogic Acquisition Board Block Diagram Power SupplyAcquisition Board 162163 164 Front Panel Board Power Distribution Board165 166 Agilent 1690A,AD-series Logic Analyzer TheorySelf-Tests Descriptions Power-up Self-Tests 1680A,AD-seriesConnectivity Tests 1690A,AD-series 167168 Acquisition Board Self Tests169 Logic Analyzer Self-Tests170 171 172 Manual Part Number Technology Licenses
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