R
4Electrical Requirements
Socket electrical requirements are measured from the
Table
1 | Mat11 loop inductance, Lloop | <4.33nH | |
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2 | Mated partial mutual inductance, L | NA | |
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3 | Maximum mutual capacitance, C | <1pF | |
4 | Maximum Ave Contact Resistance | ≤ 17mΩ | |
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| Refer to Section 4.1 for more detail. |
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| Refer to mPGA603 Socket Design |
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| Guidelines for electrical parameters |
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| with INT3 packages. |
5 | Measurement frequency(s) for | 400 MHz |
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6 | Measurement frequency(s) for | 1 GHz |
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7 | Dielectric Withstand Voltage | 360 Volts RMS |
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8 | Insulation Resistance | 800 M Ohms |
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9 | Contact Current Rating | Read and record |
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Table
1 | Mated loop inductance, Lloop | The inductance calculated for two conductors, considering |
| one forward conductor and one return conductor. | |
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2a | Mated mutual inductance, L | The inductance on a conductor due to any single |
| neighboring conductor. | |
3 | Maximum mutual capacitance, C | The capacitance between two pins/connectors. |
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4 | Maximum Average Contact Resistance | The max average resistance target is originally derived from |
| max resistance of each chain minus resistance of shorting | |
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| bars divided by number of pins in the daisy chain. |
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| This value has to be satisfied at all time. Thus, this is the |
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| spec valid at End of Line, End of Life and etc. |
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| Socket Contact Resistance: The resistance of the socket |
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| contact, interface resistance to the pin, and the entire pin to |
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| the point where the pin enters the interposer; gaps included. |
5 | Measurement frequency(s) for Capacitance | Capacitively dominate region. This is usually the lowest |
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| measurable frequency. This should be determined from the |
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| measurements done for the feasibility. |
6 | Measurement frequency(s) for Inductance | Linear region. This is usually found at higher frequency |
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| ranges. This should be determined from the measurements |
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| done for the feasibility. |
mPGA604 Socket Design Guidelines | 19 |