Cypress CY7C1347G manual Electrical Characteristics continued, Capacitance, Thermal Resistance

CY7C1347G

Electrical Characteristics (continued)

Over the Operating Range[8, 9]

Parameter	Description	Test Conditions		Min	Max	Unit
ISB3	Automatic CE	Max. VDD, Device Deselected, or	4 ns cycle, 250 MHz		105	mA
	Power Down	VIN < 0.3V or VIN > VDDQ – 0.3V
			5 ns cycle, 200 MHz		95	mA
	Current—CMOS Inputs	f = fMAX = 1/tCYC
			6 ns cycle, 166 MHz		85	mA
			7.5 ns cycle, 133 MHz		75	mA
ISB4	Automatic CE	Max. VDD, Device Deselected,			45	mA
	Power Down	VIN ≥ VIH or VIN ≤ VIL, f = 0
	Current—TTL Inputs

Capacitance

Tested initially and after any design or process changes that may affect these parameters.

Parameter	Description	Test Conditions	100 TQFP	119 BGA	165 FBGA	Unit
			Max	Max	Max
CIN	Input Capacitance	TA = 25°C, f = 1 MHz,	5	5	5	pF
		VDD = 3.3V.
CCLK	Clock Input Capacitance		5	5	5	pF
		VDDQ = 3.3V
CIO	Input/Output Capacitance		5	7	7	pF

Thermal Resistance

Tested initially and after any design or process changes that may affect these parameters.

Parameter	Description	Test Conditions	100 TQFP	119 BGA	165 FBGA	Unit
			Package	Package	Package
ΘJA	Thermal Resistance	Test conditions follow standard	30.32	34.1	20.3	°C/W
	(Junction to Ambient)	test methods and procedures for
		measuring thermal impedance,
ΘJC	Thermal Resistance		6.85	14.0	4.6	°C/W
		per EIA/JESD51.
	(Junction to Case)

AC Test Loads and Waveforms

Figure 4. AC Test Loads and Waveforms

3.3V IO Test Load

OUTPUT

3.3V

R = 317Ω

ALL INPUT PULSES

VDDQ

Z0 = 50Ω

OUTPUT

RL = 50Ω

10%

90%

5 pF

R = 351Ω

GND

≤ 1 ns

VT = 1.5V

INCLUDING

(c)

(a)

JIG AND

(b)

SCOPE

2.5V IO Test Load

OUTPUT

2.5V

R = 1667Ω

ALL INPUT PULSES

VDDQ

Z0 = 50Ω

OUTPUT

RL = 50Ω

10%

90%

5 pF

R = 1538Ω

GND

≤ 1 ns

INCLUDING

VT

= 1.25V

JIG AND

(a)

SCOPE

(c)

(b)

90%

10%

≤ 1 ns

90%

10%

≤ 1 ns

Document #: 38-05516 Rev. *F Page 10 of 22

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