HP 8753ET manual Remote programming, Test sequences, Time-domain Option

Page 19

HP 8753ET/ES supplemental characteristics (continued)

Frequency offset on/off

Sets the RF source to be swept at a fixed offset fre- quency above the receiver as required in a swept RF/IF, fixed LO, mixer test.

Service menu

Select the desired service test, service diagnostic, ser- vice or verification mode.

Test sequences

Description

Create, edit, save or recall a series of front-panel key- strokes to automate a measurement. Test sequences may contain basic stimulus and measurement func- tions (frequency, power, parameter, format, scale) advanced operations (time domain, limit testing, dis- play marker values) and basic logical branching (IF limit test fails DO sequence 5 or GOSUB).

Storage

Test sequences can be stored internally to a disk drive and can be loaded from a computer over the GP-IB interface. Sequence 6 is saved in nonvolatile storage and can be used as an autostart routine when titled AUTO.

General purpose input/output

Read or write bits to the output port to control exter- nal devices such as part handlers. Eight output and five input TTL lines are available on the parallel port.

Other functions

PAUSE/continue, wait, title sequence, print sequence, duplicate sequence, pause and select.

Time-domain (Option 010)

With the time-domain option, data from transmission or reflection measurements in the frequency domain are converted to the time domain using a Fourier transformation technique (chirp Z) and presented on the display. The time-domain response shows the mea- sured parameter value versus time. Markers may also be displayed in electrical length (or physical length if the relative propagation velocity is entered).

Time stimulus modes

Two types of time excitation stimulus waveforms can be simulated during the transformations, a step and an impulse.

Low-pass step

This stimulus, similar to a traditional time-domain reflec- tometer (TDR) stimulus waveform, is used to measure low-pass devices. The frequency-domain data should extend from DC (extrapolated value) to a higher value.

Low-pass impulse

This stimulus is also used to measure low-pass devices.

• Bandpass impulse

The bandpass impulse stimulates a pulsed RF signal (with an impulse envelope) and is used to measure the time-domain response of band-limited devices.

Windows

The windowing function can be used to modify (filter) the frequency-domain data and thereby reduce over- shoot and ringing in the time-domain response. Three types of windows are available: minimum, normal, and maximum.

Gating

The gating function can be used to selectively remove reflection or transmission time-domain responses. In converting back to the frequency-domain the effects of the responses outside the gate are removed.

Remote programming

Interface

HP-IB interface operates to IEEE 488-1978 and IEC 625 standards and IEEE 728-1982 recommended prac- tices.

Addressing

The GP-IB address can be verified or set from the front panel via the local menu and can range from 0 to 30 decimal (factory set at 16).

Pass control

Allows the HP 8753ET/ES to request control of the GP-IB (when an active controller is present) whenever it needs to output to a plotter or printer.

System controller

Lets an HP 8753ET/ES become a controller on the GP-IB to directly control a plotter or a printer.

Talker/listener

Lets the HP 8753ET/ES become an GP-IB talker/listen- er when an external controller is present.

Transfer formats

Binary (internal 48-bit floating-point complex format) ASCII 32- or 64-bit IEEE 754 floating-point format

User-accessible graphics

Using a subset of HP Graphics Language (HP-GL), vector or text graphics may be written on the

HP 8753ET/ES via GP-IB. Up to 5 kbytes of data can be stored at one time (4 bytes per vector, 2 bytes per character).

Interface function codes

SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1, DT0, C1, C2, C3, C10, E2

19

Image 19
Contents Specifications Table of contents Measurement uncertainty Measurement port characteristicsDefinitions and test conditions Dynamic rangeNetwork analyzer HP 8753ES System performance summariesHP 8753ES 50-ohm systems Mm test portsCalibration kit HP 85032B Test-port cables HP 11857D Type-N test portsFrequency range Calibration kit HP 85033D Test-port cables HP 11857DNetwork analyzer HP 8753ES 75-ohm systemsCalibration kit HP 85036B Test-port cables HP 11857B Calibration kit HP 85039B Test-port cables HP 11857B Type-F test portsKHz to 16 MHz 100 dB MHz to 3 GHz 110 dB GHz to 6 GHz 105 dB Measurement port characteristicsTest-port output characteristics7 HP 8753ES specificationsTest port input characteristics KHz to 6 GHz CharacteristicsPhase characteristics CW time sweep onlyTest port output characteristics HP 8753ES Option 011 specificationsTest port input characteristics Option CW time sweep only KHz to 3 GHz To -35 dBm GHz to 6 GHz To -30 dBm20 kHz FrequencyOption 006 300 kHz to 6 GHz HP 8753ET specificationsTest-port output characteristics KHz to 3 GHz±180˚ Test-port input characteristicsMagnitude characteristics ±500 dB Source control HP 8753ET/ES supplemental characteristics Group delay characteristics MeasurementData averaging Data accuracy enhancementDisplay control System capabilities Trace functionsStorage Data hardcopyThis stimulus is also used to measure low-pass devices Remote programmingTest sequences Time-domain OptionGeneral characteristics Options HP 85046A/B Specifications Test set specifications for OptionHP 85046A/B S-parameter test sets +30 dBm SpecificationsHP 85047A S-parameter test set +20 dBmAccessories HP 11906C 7-16 to 7-mm adapter kit HP 85039B type-F calibration kit SpecificationsHP 85038 family of calibration kits HP 11906B 7-16 to 50-Ohm type-N adapter kitTest-port return cables Verification kitsRF limiter Ohm accessory kitsHP 85024A high-frequency probe Weight DimensionsHP 8347A RF amplifier