Agilent Technologies E7401A, E7402A, E7403A, E7404A, E7405A

Chapter 1 11

Making Basic Measurements

Comparing Signals

Figure 1-1 Placing a Marker on the 10MH z Signal

9. Press Marker, Delta, to activate a second marker at the position of t he

first marker.

10.Move the second marker to another signal peak using the

front-panel knob, or by pressing Peak Search and then either

Next Pk Right or Next Pk Left. Next peak right is shown in Figure1 -2.

The amplitude and frequency difference between the markers is

displayed in the active function block and in the upper right corner

of the screen. See Figure1-2.

11. The resolution of the marker readings can be increased by turning

on the frequency count function. For more information refer to

“Making Better Frequency Measurements” on page 22.

12.Press Marker, Off to turn the markers off.

Contents

Main Signal Analysis Measurement Guide Agilent Technologies EMC Series Analyzers Notice Safety Information Warrant y LIMITATION OF WARRANTY EXCLUSIVE REMEDIES Where to Find the Latest Informa tion Page Contents Page What is in This Chapter Test Equ ipm ent Comparing Signals Signal Comparison Example 1: Page Signal Comparison Example 2: Page Resolving Signals of Equal Amplitude Resolving Signals Example: Page Page Resolving Small Signals Hidden by Large Signals Resolving Signals Example: Page Page Making Better Frequency Measurements Better Frequency Measurement Example: Page Decreasing the Frequency Span Around the Signal Decreasing the Frequency Span Example: Page Page Tracking Drifting Signals Tracking Signal Drift Example 1: Page Page Tracking Signal Drift Example 2: Page Page Page Measuring Low Level Signals Measuring Low Level Signals Example 1: Page Measuring Low Level Signals Example 2: Measuring Low Level Signals Example 3: Page Measuring Low Level Signals Example 4: Page Page Identifying Distortion Products Distortion from the Analyzer Identifying Analyzer Generated Distortion Example: Page Page Third-Order Intermodulation Distortion Identifying TOI Distortion Example: Page Page Page Measuring Signal-to-Noise Signal-to-Noise Measurement Example: S/N 70 dB/Hz10 30 kHz()log+ 25.23 dB30 kHz()== Making Noise Measurements Noise Measurement Example 1: Page Page Page Page Noise Measurement Example 2: Noise Measurement Example 3: Page Page Demodulating AM Signals (Using the Analyzer As a Fixed Tuned Receiver) Demodulating an AM Signal Example 1: Page Page Page Page Page Demodulating FM Signals Demodulating a FM Signal Example: Page Page Page Page Whats in This Chapter Required Test Equipment Making Stimulus Response Measu rements What Are Stimulus Response Measurements? Using An Analyzer With A Tracking Generator Stepping Through a Transmission Measurement Page Page Page Page Tracking Generator Unleveled Condition Measuring Device Bandwidth Page Page Measuring Stop Band Attenuation Using Log Sweep Page Page Page Page Making a Reflection Calibration Measurement Example: Reflection Calibration Measuring the Return Loss Chapter 2 87 VSWR 110 Making Complex Measurements Making a Reflection Calibration Measurement -----------------------= Table 2-1 Power to VSWR Conversion + 110 Demodulating and Listening to an AM Signal Demodulating and Listening to an AM Signal Example 1: Demodulating and Listening to an AM Signal Example 2:

Agilent Technologies - page 11

Models: E7401A E7402A E7403A E7404A E7405A