Agilent Technologies E7401A, E7402A, E7403A, E7404A, E7405A S/N 70 dB/Hz10 30 kHz()log+ 25.23 dB30 kHz()==

50 Chapter 1

Making Basic Measurements

Measuring Signal-to-Noise

11.P ress More, Function, Marker Noise to view the results of the signa l t o

noise measurement. See Figure1-41.

Figure 1-41 Measuring the Signal-to-Noise

Read the signal-to-noise in dB/Hz, that is with the noise value

determined for a 1 Hz noise bandwidth. If you wish the noise value for a

different bandwidth, decrease the ratio by . For example, if

the analyzer reading is −70 dB/Hz but you have a channel bandwidth of

30 kHz:

Note that the display detection mode is now average. If the delta

marker is within half a division of the response to a discrete signal, the

amplitude reference signal in this c ase , the r e is a potential for error in

the noise measurement. See “Making Noise Measurements” on page51.

10 log×BW()

S/N 70 dB/Hz–10 30 kHz()log×+ 25.23 dB–30 kHz()⁄==

Contents

Main Signal Analysis Measurement Guide Agilent Technologies EMC Series Analyzers Notice Safety Information Warrant y LIMITATION OF WARRANTY EXCLUSIVE REMEDIES Where to Find the Latest Informa tion Page Contents Page What is in This Chapter Test Equ ipm ent Comparing Signals Signal Comparison Example 1: Page Signal Comparison Example 2: Page Resolving Signals of Equal Amplitude Resolving Signals Example: Page Page Resolving Small Signals Hidden by Large Signals Resolving Signals Example: Page Page Making Better Frequency Measurements Better Frequency Measurement Example: Page Decreasing the Frequency Span Around the Signal Decreasing the Frequency Span Example: Page Page Tracking Drifting Signals Tracking Signal Drift Example 1: Page Page Tracking Signal Drift Example 2: Page Page Page Measuring Low Level Signals Measuring Low Level Signals Example 1: Page Measuring Low Level Signals Example 2: Measuring Low Level Signals Example 3: Page Measuring Low Level Signals Example 4: Page Page Identifying Distortion Products Distortion from the Analyzer Identifying Analyzer Generated Distortion Example: Page Page Third-Order Intermodulation Distortion Identifying TOI Distortion Example: Page Page Page Measuring Signal-to-Noise Signal-to-Noise Measurement Example: S/N 70 dB/Hz10 30 kHz()log+ 25.23 dB30 kHz()== Making Noise Measurements Noise Measurement Example 1: Page Page Page Page Noise Measurement Example 2: Noise Measurement Example 3: Page Page Demodulating AM Signals (Using the Analyzer As a Fixed Tuned Receiver) Demodulating an AM Signal Example 1: Page Page Page Page Page Demodulating FM Signals Demodulating a FM Signal Example: Page Page Page Page Whats in This Chapter Required Test Equipment Making Stimulus Response Measu rements What Are Stimulus Response Measurements? Using An Analyzer With A Tracking Generator Stepping Through a Transmission Measurement Page Page Page Page Tracking Generator Unleveled Condition Measuring Device Bandwidth Page Page Measuring Stop Band Attenuation Using Log Sweep Page Page Page Page Making a Reflection Calibration Measurement Example: Reflection Calibration Measuring the Return Loss Chapter 2 87 VSWR 110 Making Complex Measurements Making a Reflection Calibration Measurement -----------------------= Table 2-1 Power to VSWR Conversion + 110 Demodulating and Listening to an AM Signal Demodulating and Listening to an AM Signal Example 1: Demodulating and Listening to an AM Signal Example 2:

Agilent Technologies S/N 70 dB/Hz10 30 kHz()log+ 25.23 dB30 kHz()==

Models: E7401A E7402A E7403A E7404A E7405A