Fujitsu MHV2080AS manual Selective self-test log data structure, Test span, Current LBA under test

Models: MHV2060AS MHV2080AS MHV2040AS

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Interface

Table 5.19 Selective self-test log data structure

Offset

 

Description

Initial

 

 

 

 

00h, 01h

Data Structure Revision Number

01h, 00h

 

 

 

 

 

 

02h...

09h

Test Span 1

Starting LBA

00h...

00h

 

 

 

 

 

0Ah...

11h

Ending LBA

00h...

00h

 

 

 

 

 

 

 

12h...

19h

Test Span 2

Starting LBA

00h...

00h

 

 

 

 

 

1Ah...

21h

Ending LBA

00h...

00h

 

 

 

 

 

 

 

22h...

29h

Test Span 3

Starting LBA

00h...

00h

 

 

 

 

 

2Ah...

31h

Ending LBA

00h...

00h

 

 

 

 

 

 

 

32h...

39h

Test Span 4

Starting LBA

00h...

00h

 

 

 

 

 

3Ah...

41h

Ending LBA

00h...

00h

 

 

 

 

 

 

 

42h...

49h

Test Span 5

Starting LBA

00h...

00h

 

 

 

 

 

4Ah...

51h

Ending LBA

00h...

00h

 

 

 

 

 

 

 

52h...

151h

Reserved

 

00h...

00h

 

 

 

 

 

 

152h...

1EBh

Vender Unique

 

00h...

00h

 

 

 

 

 

1Ech...

1F3h

Current LBA under test

00h...

00h

 

 

 

 

 

1F4h...

1F5h

Current Span under test

00h...

00h

 

 

 

 

 

 

1F6h...

1F7h

Feature Flags

 

00h...

00h

 

 

 

 

1F8h

 

Offline Execution Flag

00h

 

Vender Unique

 

 

1F9h

Selective Offline Scan Number

00h

 

 

 

 

1FAh, 1FBh

 

Reserved

00h, 00h

 

 

 

 

1FCh, 1FDh

Selective Self-test pending time [min]

00h, 00h

 

 

 

 

1FEh, 1FFh

Check sum

 

00h, FFh

 

 

 

 

 

 

Test span

Selective self-test log provides for the definition of up to five test spans. If the starting and ending LBA values for a test span are both zero, a test span is not defined and not tested.

Current LBA under test

As the self-test progress, the device shall modify this value to contain the LBA currently being tested.

Current span under test

As the self-test progress, the device shall modify this value to contain the test span number currently being tested.

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C141-E221

Page 132
Image 132
Fujitsu MHV2080AS manual Selective self-test log data structure, Test span, Current LBA under test, Current span under test