Fujitsu MHV2040AS, MHV2080AS Features register values subcommands and functions 2, Smart Read LOG

5.3 Host Commands

Table 5.7 Features register values (subcommands) and functions (2 of 3)

Features Resister				Function
X’D5’	SMART READ LOG:
	A device which receives this sub-command asserts the BSY bit, then reads
	the log sector specified in the SN register. Next, it clears the BSY bit and
	transmits the log sector to the host computer.
		SN:	SC:	Log sector
		00h:	01h:	SMART log directory
		01h:	01h:	SMART summary error log
		02h:	33h:	SMART comprehensive error log
		06h:	01h:	SMART self-test log
		09h:	01h:	SMART selective self-test log
		80h-9Fh: 01h-10h:		Host vendor log

*See Table 5.16 concerning the SMART error log data format. See Table 5.18 concerning the SMART self-test log data format. See Table 5.19 concerning the SMART selective self-test log data format.

X’D6’	SMART WRITE LOG:
	A device which receives this sub-command asserts the BSY bit and when it
	has prepared to receive data from the host computer, it sets DRQ and clears
	the BSY bit. Next, it receives data from the host computer and writes the
	specified log sector in the SN register.
	SN:	SC:	Log sector
	09h:	01h:	SMART selective self-test log
	80h-9Fh: 01h-10h		Host vendor log
	* The host can write any desired data in the host vendor log.
X’D8’	SMART ENABLE OPERATIONS:
	This subcommand enables the failure prediction feature. The setting is
	maintained even when the device is turned off and then on.
	When the device receives this subcommand, it asserts the BSY bit, enables
	the failure prediction feature, and then clears the BSY bit.
X’D9’	SMART DISABLE OPERATIONS:
	This subcommand disables the failure prediction feature. The setting is
	maintained even when the device is turned off and then on.
	When the device receives this subcommand, it asserts the BSY bit, disables
	the failure prediction feature, and then clears the BSY bit.

C141-E221 5-43