Fujitsu MHV2100BH manual Current Span under test, Feature Flags, Selective self-test feature flags

Models: MHV2100BH MHV2040BH MHV2060BH MHV2080BH

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Interface

Current Span under test

As the self-test progress, the device shall modify this value to contain the test span number currently being tested.

Feature Flags

 

Table 5.23 Selective self-test feature flags

 

 

 

Bit

 

Description

 

 

 

0

 

Vendor specific (unused)

 

 

 

1

 

When set to one, perform off-line scan after selective test

 

 

 

2

 

Vendor specific (unused)

 

 

 

3

 

When set to one, off-line scan after selective test is pending.

 

 

 

4

 

When set to one, off-line scan after selective test is active.

 

 

 

5...15

 

Reserved

 

 

 

Bit [l] shall be written by the host and returned unmodified by the device. Bit [3:4] shall be written as zeros by the host and the device shall modify them as the test progress.

Selective Self-test pending time [min]

The selective self-test pending time is the time in minutes from power-on to the resumption of the off-line testing if the pending bit is set.

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C141-E224

Page 144
Image 144
Fujitsu MHV2100BH, MHV2080BH, MHV2040BH, MHV2060BH Current Span under test, Feature Flags, Selective self-test feature flags