
CYV15G0404RB
Pin Definitions (continued)
CYV15G0404RB Quad HOTLink II Deserializing Reclocker
Name | IO Characteristics  | Signal Description  | 
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DATA[7:0]  | LVTTL input  | Control Data Bus. The DATA[7:0] bus is the input data bus that configures the  | 
  | asynchronous,  | device. The WREN input writes the values of the DATA[7:0] bus into the latch  | 
  | internal   | specified by address location on the ADDR[3:0] bus.[3] Table 3, “Device Configu-  | 
  | 
  | ration and Control Latch Descriptions,” on page 14 lists the configuration latches  | 
  | 
  | within the device, and the initialization value of the latches when RESET is  | 
  | 
  | asserted. Table 4, “Device Control Latch Configuration Table,” on page 16 shows  | 
  | 
  | the way the latches are mapped in the device.  | 
Internal Device Configuration Latches | 
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RXRATE[A..D]  | Internal Latch[4]  | Receive Clock Rate Select. | 
SDASEL[2..1][A..D]  | Internal Latch[4]  | Signal Detect Amplitude Select. | 
[1:0]  | 
  | 
  | 
RXPLLPD[A..D]  | Internal Latch[4]  | Receive Channel Power Control. | 
RXBIST[A..D][1:0]  | Internal Latch[4]  | Receive BIST Disabled. | 
ROE2[A..D]  | Internal Latch[4]  | Reclocker Differential Serial Output Driver 2 Enable. | 
ROE1[A..D]  | Internal Latch[4]  | Reclocker Differential Serial Output Driver 1 Enable. | 
GLEN[11..0]  | Internal Latch[4]  | Global Latch Enable. | 
FGLEN[2..0]  | Internal Latch[4]  | Force Global Latch Enable. | 
Factory Test Modes | 
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SCANEN2 | LVTTL input,  | Factory Test 2. The SCANEN2 input is for factory testing only. Leave this input  | 
  | internal pull down  | as a NO CONNECT, or GND only.  | 
TMEN3 | LVTTL input,  | Factory Test 3. The TMEN3 input is for factory testing only. Leave this input as a  | 
  | internal pull down  | NO CONNECT, or GND only.  | 
Analog I/O | 
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ROUTA1±  | CML Differential  | Primary Differential Serial Data Output. The ROUTx1±   | 
ROUTB1±  | Output  | outputs (+3.3V referenced) can drive terminated transmission lines or standard  | 
ROUTC1±  | 
  | |
ROUTD1±  | 
  | connections.  | 
ROUTA2±  | CML Differential  | Secondary Differential Serial Data Output. The ROUTx2±   | 
ROUTB2±  | Output  | CML outputs (+3.3V referenced) are capable of driving terminated transmission  | 
ROUTC2±  | 
  | lines or standard   | 
ROUTD2±  | 
  | |
INA1± | Differential Input  | Primary Differential Serial Data Input. The INx1± input accepts the serial data  | 
INB1±  | 
  | stream for deserialization. The INx1± serial stream passes to the receive CDR  | 
INC1±  | 
  | circuit to extract the data content when INSELx = HIGH.  | 
IND1±  | 
  | 
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INA2±  | Differential Input  | Secondary Differential Serial Data Input. The INx2± input accepts the serial  | 
INB2±  | 
  | data stream for deserialization. The INx2± serial stream passes to the receiver  | 
INC2±  | 
  | CDR circuit to extract the data content when INSELx = LOW.  | 
IND2±  | 
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JTAG Interface | 
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TMS | LVTTL Input,  | Test Mode Select. Controls access to the JTAG Test Modes. If TMS is HIGH for  | 
  | internal pull up  | >5 TCLK cycles, the JTAG test controller resets.  | 
TCLK  | LVTTL Input,  | JTAG Test Clock. | 
  | internal pull down  | 
  | 
Note
4. See Device Configuration and Control Interface for detailed information on the internal latches.
Document #:   | Page 10 of 27  | 
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