Agilent Technologies 8753ET, 8753ES manual Test Sequences, Time-domain Option, Remote Programming

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Frequency offset on/off

Sets the RF source to be swept at a fixed offset frequency above the receiver as required in a swept RF/IF, fixed LO, mixer test.

Service menu

Select the desired service test, service diagnostic, service or verification mode.

Test Sequences

Description

Create, edit, save, or recall a series of front-panel key- strokes to automate a measurement. Test sequences may contain basic stimulus and measurement func- tions (frequency, power, parameter, format, scale) advanced operations (time domain, limit testing, display marker values) and basic logical branching (IF limit test fails DO sequence 5 or GOSUB).

Storage

Test sequences can be stored internally to a disk drive and can be loaded from a computer over the GPIB interface. Sequence 6 is saved in nonvolatile storage and can be used as an autostart routine when titled AUTO.

General purpose input/output

Read or write bits to the output port to control external devices such as part handlers. Eight output and five input TTL lines are available on the parallel port.

Other functions

PAUSE/continue, wait, title sequence, print sequence, duplicate sequence, pause, and select.

Time-domain (Option 010)

With the time-domain option, data from transmis- sion or reflection measurements in the frequency domain are converted to the time domain using a Fourier transformation technique (chirp Z) and presented on the display. The time-domain response shows the measured parameter value versus time. Markers may also be displayed in electrical length (or physical length if the relative propagation veloc- ity is entered).

Time stimulus modes

Two types of time excitation stimulus waveforms can be simulated during the transformations,

a step and an impulse.

Low-pass step

This stimulus, similar to a traditional time- domain reflectometer (TDR) stimulus wave- form, is used to measure low-pass devices. The frequency-domain data should extend from DC (extrapolated value) to a higher value.

Low-pass impulse

This stimulus is also used to measure low-pass devices.

Bandpass impulse

The bandpass impulse stimulates a pulsed RF signal (with an impulse envelope) and is used to measure the time-domain response of band- limited devices.

Windows

The windowing function can be used to modify (filter) the frequency-domain data and thereby reduce overshoot and ringing in the time-domain response. Three types of windows are available: minimum, normal, and maximum.

Gating

The gating function can be used to selectively remove reflection or transmission time-domain responses. In converting back to the frequency- domain the effects of the responses outside the gate are removed.

Remote Programming

Interface

GPIB interface operates to IEEE 488-1978 and IEC 625 standards and IEEE 728-1982 recommended practices.

Addressing

The GPIB address can be verified or set from the front panel via the local menu and can range from 0 to 30 decimal (factory set at 16).

Pass control

Allows the 8753ET/ES to request control of the GPIB (when an active controller is present) when- ever it needs to output to a plotter or printer.

System controller

Lets an 8753ET/ES become a controller on the GPIB to directly control a plotter or a printer.

Talker/listener

Lets the 8753ET/ES become a GPIB talker/listener when an external controller is present.

Transfer formats

Binary (internal 48-bit floating-point complex format) ASCII 32- or 64-bit IEEE 754 floating- point format.

User-accessible graphics

Using a subset of HP Graphics Language (HP-GL), vector or text graphics may be written on the 8753ET/ES via GPIB. Up to 5 kbytes of data can be stored at one time (4 bytes per vector, 2 bytes per character).

Interface function codes

 

SH1, AH1, T6, TE0, L4, LE0, SR1, RL1, PP0, DC1,

 

DT0, C1, C2, C3, C10, E2

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Image 19 Contents
8753ET and 8753ES Network Analyzers, 30 kHz to 3 or 6 GHz Agilent 8753ET/ESTable of Contents Dynamic Range Measurement Port CharacteristicsMeasurement Uncertainty Reflection uncertainty ConfigurationAgilent 8753ES 50-ohm systems System dynamic rangeCalibration kit 85032B Test-port cables 11857D Type-N test portsCalibration kit 85033D Test-port cables 11857D Network analyzer Agilent 8753ES 75-Ohm SystemsCalibration kit 85036B Test-port cables 11857B Calibration kit 85039B Test-port cables 11857B Type-F test portsKHz to 16 MHz 100 dB MHz to 3 GHz 110 dB Measurement Port CharacteristicsAgilent 8753ET 50-ohm systems Part numberTest-Port Output Characteristics7 Agilent 8753ES SpecificationsTest-Port Input Characteristics Magnitude Characteristics Phase CharacteristicsExternal source mode1 CW time sweep only Test Port Output Characteristics Agilent 8753ES Option 011 SpecificationsTest Port Input Characteristics Option External source mode4 Frequency offset mode3Channel input requirements1 Agilent 8753ET Specifications Stability2 KHz to 3 GHz Display resolutionInput frequency accuracy requirement2 Reference level RangeSource Control Agilent 8753ET/ES Supplemental CharacteristicsGroup Delay Characteristics MeasurementData Averaging Data Accuracy EnhancementDisplay Control System Capabilities Trace FunctionsStorage Data HardcopyTime-domain Option Test SequencesRemote Programming Front Panel Connectors General CharacteristicsRear-Panel Connectors Options Cabinet Dimensions 8753ET/ESGeneral Conditions Agilent 85046A/B Specifications Test Set Specifications for OptionAgilent 85046A/B S-Parameter Test Sets Agilent 85047A S-Parameter Test Set SpecificationsCalibration Kits AccessoriesAgilent 11906 Family of Adapter Kits Agilent 85038 Family of Calibration KitsTest-Port Return Cables Verification KitsRF Limiter Ohm Accessory Kits85024A High-Frequency Probe Agilent 8347A RF Amplifier Weight Net 3.5 kg 7.7 lb