Agilent Technologies FS2334 user manual

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4)Repeat this procedure using the next rising edge of Write – Command:CK2_TZ and the corresponding data burst cycle (it will be right next to the burst cycle you just looked at). Measure the time difference from the rising edge of Write – Command:CK2_TZ to both the center of the data eyes associated with the rising edge of the Data strobe and then the falling edge of the Data strobe.

5)Repeat this procedure for several cycles of the burst. You may do this for other bursts as well if you wish to cover different types of data burst patterns and account for possible edge jitter sources. You may also find that the timing varies slightly from Data byte to Data byte. This can be due to differences in the DIMM layout and individual differences in the DRAMs on the DIMM. Compute the average of the times between the rising edge of Write – Command:CK2_TZ for each byte associated with the rising and separately for the falling labels.

6)Now it is time to use this delay information to set the logic analyzer sample position. From the “Sampling” tab of the “Write - Command” analyzer window click the ”Thresholds and Sampling Positions” button to bring up the sample positions for Write data labels. (The write data labels are shown below).

7)Set the sample position to be equal to the average time you computed in step 5. The easiest way to do this is to point to the blue vertical sample position bar with the mouse and press and hold the left mouse button while dragging the blue bars as far to the left side of the display as possible. This will cause all the blue bars for that

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Contents DDR2 Dimm High Speed Probe FS2334 Product Warranty Appendix For Technical Support For Sales and Marketing SupportProduct Warranty Exclusive RemediesSoftware License Agreement Introduction DefinitionsFS2334 Probe Description Probe Technical Feature SummaryProbe Components Signal Threshold Voltage Settings Signal Assignments on Probe PodsConnecting the DDR2 Probe to the Logic Analyzer Test Points Signal Isolation on the Probe Connecting to your Target SystemBuffered signals on the probe Write state analysis Page Software Requirements Setting up the 169xx Analyzer169xx Licensing Offline Analysis Page TimingZoom Analysis Decoding DDR CommandsTaking a Trace, Triggering, and Seeing Measurement Results State Analysis OverviewState Analysis Operation Read and Write at 667MT/s or slower Process for setting sampling positions at speeds of 800MT/s State analysis calibration procedure Page Page Adjusting the sampling positions with controlled stimulus Page State Display FS1140 Installation and Licensing Loading the FS1140Setting up the FS1140 DDR2 Tool Statistics Export Timing AnalysisPage Header 1 Command AppendixDP16P/ CLK CK0 Header 2 Command NC3 Header 3 Write DQ9 Header 4 Write Ground D13 DQ22 20K ohm to D14 DQ18 D15 DQ23 Header 5 Write CB0 CB1 20K ohm to Ground D13 No connection D14 D15 Header 6 Write DM5DQS14 Header 7 -Write 20K ohm to Ground D13 DQ50 D14 DQ55 D15 DQ51 Header 8 Write SDA Header 12 Read Duplicates only data signals 20K ohm to Ground D15 No connection Header 10 Read Duplicates only data signals DP16P/ CLK CB7 Header 11 Read Duplicates only data signals DP16P/ CLK RAS Header 9 Read Duplicates only data signals DP16P/ CLK CK2 Header 13 Read Duplicates only data signals Ground D13 DQ50 20K ohm to D14 DQ55 D15 DQ51
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