Agilent Technologies FS2334 user manual

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label to be set to the same value. Then you can drag the blue sample position bar back to the right to place it in the position you measured in step 5. The sample position is indicated on the scale at the top of the display as well as on the side under the “Sampling Position” column. The figure above shows the DATA31-0_R label sample position set to .110 ns and DATA31-0_F sample position set to 1.59 ns. This means that a 1.59ns average delay was measured to the center of the data eye associated with a falling data strobe edge for a Write data burst on the bus after a valid State Clock edge.

8)After making these adjustments to the Write Data Sampling positions, go back to step #1 and trigger on your known data pattern again. Check your Write - Command listing for the State data values across multiple Write bursts. They should be close to or equal to the known data written. There may be a pattern of bits that are incorrect and those bits will need further adjustment to their sample positions following the steps outlined above until you have the Write data sampling positions set to values that allow for proper data capture.

This completes the procedure for the Write labels. Use the same procedure using Read bursts and the Read data labels. Write data eyes are centered on the edge of the strobes whereas reads straddle the DQS strobes.

You should now be ready to take state traces and be confident you will capture bus traffic correctly. You may want to save the settings that you have either in the current configuration or in a new one.

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Contents DDR2 Dimm High Speed Probe FS2334 Product Warranty Appendix For Sales and Marketing Support For Technical SupportExclusive Remedies Product WarrantySoftware License Agreement Definitions IntroductionProbe Components Probe Technical Feature SummaryFS2334 Probe Description Connecting the DDR2 Probe to the Logic Analyzer Signal Assignments on Probe PodsSignal Threshold Voltage Settings Test Points Buffered signals on the probe Connecting to your Target SystemSignal Isolation on the Probe Write state analysis Page 169xx Licensing Setting up the 169xx AnalyzerSoftware Requirements Offline Analysis Page Taking a Trace, Triggering, and Seeing Measurement Results Decoding DDR CommandsTimingZoom Analysis Overview State AnalysisState Analysis Operation Read and Write at 667MT/s or slower Process for setting sampling positions at speeds of 800MT/s State analysis calibration procedure Page Page Adjusting the sampling positions with controlled stimulus Page State Display Loading the FS1140 FS1140 Installation and LicensingSetting up the FS1140 DDR2 Tool Statistics Timing Analysis ExportPage Appendix Header 1 CommandDP16P/ CLK CK0 Header 2 Command NC3 Header 3 Write DQ9 Header 4 Write Ground D13 DQ22 20K ohm to D14 DQ18 D15 DQ23 Header 5 Write CB0 CB1 20K ohm to Ground D13 No connection D14 D15 Header 6 Write DM5DQS14 Header 7 -Write 20K ohm to Ground D13 DQ50 D14 DQ55 D15 DQ51 Header 8 Write SDA Header 12 Read Duplicates only data signals 20K ohm to Ground D15 No connection Header 10 Read Duplicates only data signals DP16P/ CLK CB7 Header 11 Read Duplicates only data signals DP16P/ CLK RAS Header 9 Read Duplicates only data signals DP16P/ CLK CK2 Header 13 Read Duplicates only data signals Ground D13 DQ50 20K ohm to D14 DQ55 D15 DQ51
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