Agilent Technologies FS2334 user manual Adjusting the sampling positions with controlled stimulus

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Adjusting the sampling positions with controlled stimulus

This is a special case requiring special stimulus of the DDR2 DIMM bus. This may involve the use of a special memory test card from Ultra-X that can create this special stimulus

The Auto Sample Position Setup and Auto Threshold functions of the Agilent logic analyzer are the most precise method of determining the data valid window for signals and then setting each logic analyzer sample position to that optimum value for state analysis. There are several basic concepts that should be understood first. In order to run Auto Sample Position Setup and Auto Threshold on the Data signals it is important that the target system is programmed to generate exclusively Write or Read traffic. This is the only way to get usable data windows to set the sampling positions of both the Read and Write Data labels on the logic analyzer. At these speeds even ½ a data strobe bit width of timing relationship shift between the strobe (clock) and the data bits will eliminate the window.

The Threshold setting for clocks and signals can have a significant effect on the size of the eyes. At speeds of 667MT/s or higher even a 50mV change in the threshold can make all the difference in the eye size as measured at the logic analyzer. The best way to determine this level is through trial and error, or through use of the Auto Threshold function.

The Command/Address/Control signals are all qualified by Chip Select (S0:1), and therefore one of these signals should be used as a clock qualifier when using Eyefinder to set sampling positions. However, 600MHz State speed on the Agilent logic analyzer does not provide clock qualification. You can set the sampling speed to 300MHz and slow the system DDR clock down to 333MHz (667MT/s) and run Eyefinder on the Command/Address/Control signals with the S0 clock qualification. Set the sampling speed and system DDR clock back afterwards. Alternatively, the use of a special memory test may provide a mode where there are continuous Chip Select qualified commands at 800MT/s

1.To setup the sampling positions for Address, Command and Control signals. This can be done using a Timing or State configuration as they use CK0 as the clock input for the logic analyzer. Make sure the Clock mode is Rising edge. Set the Sampling Options to 300MHz and select S0 as a Clock Qualifier – Low, (refer to section on secondary Clock inputs). Generate some bus traffic and run Auto Sample Position Setup and/or Auto Threshold as required to establish correct Threshold settings, valid eye openings, and sample positions for these signals. NOTE: You have to have the target system running at 667MT/s for this process.

2.For Data signal sample positions, initiate traffic on the target system that generates as much only Write bursts to the DIMM as possible. If there are Read bursts contained in this traffic the positions of the Data signal edges change relative Clock input and this will close the valid eye openings for all the Data signals. All Clock cycles that occur without Write Data transfers will also close down the eyes. Run Auto Sample Position Setup and/or Auto Threshold as required to establish correct Threshold settings, valid eye openings, and sample positions for these signals. Move the sample positions for the Data Strobes and all the Data labels (rising and falling) to the center of the valid windows for those labels as shown below.

3.Initiate traffic on the target system that generates only Read bursts to the DIMM. If there are Write bursts contained in this traffic the positions of the Data

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Contents DDR2 Dimm High Speed Probe FS2334 Product Warranty Appendix For Technical Support For Sales and Marketing SupportProduct Warranty Exclusive RemediesSoftware License Agreement Introduction DefinitionsProbe Technical Feature Summary FS2334 Probe DescriptionProbe Components Signal Assignments on Probe Pods Signal Threshold Voltage SettingsConnecting the DDR2 Probe to the Logic Analyzer Test Points Connecting to your Target System Signal Isolation on the ProbeBuffered signals on the probe Write state analysis Page Setting up the 169xx Analyzer Software Requirements169xx Licensing Offline Analysis Page Decoding DDR Commands TimingZoom AnalysisTaking a Trace, Triggering, and Seeing Measurement Results State Analysis OverviewState Analysis Operation Read and Write at 667MT/s or slower Process for setting sampling positions at speeds of 800MT/s State analysis calibration procedure Page Page Adjusting the sampling positions with controlled stimulus Page State Display FS1140 Installation and Licensing Loading the FS1140Setting up the FS1140 DDR2 Tool Statistics Export Timing AnalysisPage Header 1 Command AppendixDP16P/ CLK CK0 Header 2 Command NC3 Header 3 Write DQ9 Header 4 Write Ground D13 DQ22 20K ohm to D14 DQ18 D15 DQ23 Header 5 Write CB0 CB1 20K ohm to Ground D13 No connection D14 D15 Header 6 Write DM5DQS14 Header 7 -Write 20K ohm to Ground D13 DQ50 D14 DQ55 D15 DQ51 Header 8 Write SDA Header 12 Read Duplicates only data signals 20K ohm to Ground D15 No connection Header 10 Read Duplicates only data signals DP16P/ CLK CB7 Header 11 Read Duplicates only data signals DP16P/ CLK RAS Header 9 Read Duplicates only data signals DP16P/ CLK CK2 Header 13 Read Duplicates only data signals Ground D13 DQ50 20K ohm to D14 DQ55 D15 DQ51