Agilent Technologies FS2334 user manual Ground D13 DQ50 20K ohm to D14 DQ55 D15 DQ51

Page 59

 

 

 

 

 

 

 

 

 

Logic Analyzer

SAMTEC Pin

SAMTEC Pin

Logic Analyzer

Signal

 

 

channel

number

channel

name/Logical

 

 

number

 

 

number

 

number

Signal Name

 

 

 

 

 

 

 

 

 

 

 

 

 

Ground

59

60

D13

DQ50

 

 

 

 

 

 

 

 

 

20K ohm to

61

62

Ground

 

 

 

Ground

 

 

 

 

 

 

 

 

 

Ground

63

64

D14

DQ55

 

 

 

 

 

 

 

 

 

20K ohm to

65

66

Ground

 

 

 

Ground

 

 

 

 

 

 

 

 

 

Ground

67

68

D15

DQ51

 

 

 

 

 

 

 

 

 

20K ohm to

69

70

Ground

 

 

 

Ground

 

 

 

 

 

 

 

 

 

Ground

71

72

NC

 

 

 

 

 

 

 

 

 

 

NC

73

74

Ground

 

 

 

 

 

 

 

 

 

 

Ground

75

76

NC

 

 

 

 

 

 

 

 

 

 

Ground

77

78

Ground

 

 

 

 

 

 

 

 

 

 

Ground

79

80

DP16P/ CLK

DQ60

 

 

 

 

 

 

 

 

 

20K ohm to

81

82

Ground

 

 

 

Ground

 

 

 

 

 

 

 

 

 

Ground

83

84

DP16N/

Ground

 

 

CLKN

 

 

 

 

 

 

 

 

25K ohm to

85

86

Ground

 

 

 

Ground (PID)

 

 

 

 

 

 

 

 

 

Ground

87

88

NC

 

 

 

 

 

 

 

 

 

 

NC

89

90

Ground

 

 

 

 

 

 

 

 

59

Image 59
Contents DDR2 Dimm High Speed Probe FS2334 Product Warranty Appendix For Sales and Marketing Support For Technical SupportExclusive Remedies Product WarrantySoftware License Agreement Definitions IntroductionProbe Components Probe Technical Feature SummaryFS2334 Probe Description Connecting the DDR2 Probe to the Logic Analyzer Signal Assignments on Probe PodsSignal Threshold Voltage Settings Test Points Buffered signals on the probe Connecting to your Target SystemSignal Isolation on the Probe Write state analysis Page 169xx Licensing Setting up the 169xx AnalyzerSoftware Requirements Offline Analysis Page Taking a Trace, Triggering, and Seeing Measurement Results Decoding DDR CommandsTimingZoom Analysis Overview State AnalysisState Analysis Operation Read and Write at 667MT/s or slower Process for setting sampling positions at speeds of 800MT/s State analysis calibration procedure Page Page Adjusting the sampling positions with controlled stimulus Page State Display Loading the FS1140 FS1140 Installation and LicensingSetting up the FS1140 DDR2 Tool Statistics Timing Analysis ExportPage Appendix Header 1 CommandDP16P/ CLK CK0 Header 2 Command NC3 Header 3 Write DQ9 Header 4 Write Ground D13 DQ22 20K ohm to D14 DQ18 D15 DQ23 Header 5 Write CB0 CB1 20K ohm to Ground D13 No connection D14 D15 Header 6 Write DM5DQS14 Header 7 -Write 20K ohm to Ground D13 DQ50 D14 DQ55 D15 DQ51 Header 8 Write SDA Header 12 Read Duplicates only data signals 20K ohm to Ground D15 No connection Header 10 Read Duplicates only data signals DP16P/ CLK CB7 Header 11 Read Duplicates only data signals DP16P/ CLK RAS Header 9 Read Duplicates only data signals DP16P/ CLK CK2 Header 13 Read Duplicates only data signals Ground D13 DQ50 20K ohm to D14 DQ55 D15 DQ51