Allied Telesis AT-2973T/4, AT-2973SX manual Test Description Number Name

Chapter 12: User Diagnostics

	Table 9. Diagnostic Tests (Continued)
	Test	Description
Number	Name
	Group B: Memory Tests
B1	TXP Scratchpad
B2	TPAT Scratchpad
B3	RXP Scratchpad
B4	COM Scratchpad
B5	CP Scratchpad
B6	MCP Scratchpad	The Group B tests verify all of the memory
B7	TAS Header Buffer
		blocks of the Broadcom NetXtreme II adapter
B8	TAS Payload Buffer	by writing various data patterns (0x55aa55aa,
		0xaa55aa55, walking zeroes, walking ones,
B9	RBUF via GRC
		address, etc.) to each memory location,
		reading back the data, and then comparing it
B10	RBUF via Indirect
		to the value written. The fixed data patterns
	Access
		are used to ensure that no memory bit is stuck
B11	RBUF Cluster List	high or low, while the walking zeroes/ones
		and address tests are used to ensure
B12	TSCH List
		that memory writes do not corrupt adjacent
		memory locations.
B13	CSCH List
B14	RV2P Scratchpads
B15	TBDC Memory
B16	RBDC Memory
B17	CTX Page Table
B18	CTX Memory
	Group C: Block Tests
C1	CPU Logic and	Verifies the basic logic functionality of all the
	DMA Interface	on-chip CPUs. It also exercises the DMA
		interface exposed to those CPUs. The internal
		CPU tries to initiate DMA activities (both read
		and write) to system memory and then
		compares the values to confirm that the DMA
		operation completed successfully.

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