Chapter 12 Performance Monitoring

12.4 Performance-Monitoring Parameter Definitions

Table 12-2

Performance Monitoring Parameters (continued)

 

 

 

Parameter

 

Definition

 

 

 

ES-PFE

 

Far-End STS Path Errored Seconds (ES-PFE) is a count of the seconds when at least

 

 

one STS path BIP error was detected. An AIS-P defect (or a lower-layer,

 

 

traffic-related, far-end defect) or an LOP-P defect can also cause an STS ES-PFE.

 

 

 

ES-S

 

Section Errored Seconds (ES-S) is a count of the number of seconds when at least one

 

 

section-layer BIP error was detected or an SEF or LOS defect was present.

 

 

 

FC-L

 

Line Failure Count (FC-L) is a count of the number of near-end line failure events. A

 

 

failure event begins when an AIS-L failure is declared or when a lower-layer,

 

 

traffic-related, near-end failure is declared. This failure event ends when the failure

 

 

is cleared. A failure event that begins in one period and ends in another period is

 

 

counted only in the period where it begins.

 

 

 

FC-LFE

 

Far-End Line Failure Count (FC-LFE) is a count of the number of far-end line failure

 

 

events. A failure event begins when Line RFI-L failure is declared, and it ends when

 

 

the RFI-L failure clears. A failure event that begins in one period and ends in another

 

 

period is counted only in the period where it began.

 

 

 

FC-P

 

Near-End STS Path Failure Counts (FC-P) is a count of the number of near-end STS

 

 

path failure events. A failure event begins when an AIS-P failure, an LOP-P failure,

 

 

a UNEQ-P failure, or a TIM-P failure is declared. A failure event also begins if the

 

 

STS PTE that is monitoring the path supports ERDI-P for that path. The failure event

 

 

ends when these failures are cleared.

 

 

 

FC-PFE

 

Far-End STS Path Failure Counts (FC-PFE) is a count of the number of near-end STS

 

 

path failure events. A failure event begins when an AIS-P failure, an LOP-P failure,

 

 

a UNEQ-P failure, or a TIM-P failure is declared. A failure event also begins if the

 

 

STS PTE that is monitoring the path supports ERDI-P for that path. The failure event

 

 

ends when these failures are cleared.

 

 

 

LBC

 

Laser Bias Current (LBC) is represented by the percentage of the normal (100%)

 

 

laser bias current of the laser on the card port. The high laser bias current

 

 

(LBC-HIGH) threshold is the percentage of the normal laser bias current when a high

 

 

current TCA occurs. The low laser bias current (LBC-LOW) threshold is the

 

 

percentage of the normal laser bias current when a low current TCA occurs.

 

 

 

NPJC-PDET

 

Negative Pointer Justification Count, STS Detected (NPJC-PDET).

 

 

NPJC-PDET-P

Negative Pointer Justification Count, STS Path Detected (NPJC-Pdet-P) is a count of

 

 

the negative pointer justifications detected on a particular path in an incoming

 

 

SONET signal.

 

 

NPJC-PGEN-P

Negative Pointer Justification Count, STS Path Generated (NPJC-Pgen-P) is a count

 

 

of the negative pointer justifications generated for a particular path to reconcile the

 

 

frequency of the SPE with the local clock.

 

 

 

OPT

 

Optical Power Transmitted (OPT) is represented by the percentage of the normal

 

 

(100%) optical transmit power of the laser on the card port. The high optical power

 

 

transmitted (OPT-HIGH) threshold is the percentage of the normal transmit optical

 

 

power when a high transmit power TCA occurs. The low optical power transmitted

 

 

(OPT-LOW) threshold is the percentage of the normal transmit optical power when

 

 

a low transmit power TCA occurs.

 

 

 

Cisco ONS 15600 Reference Manual, R7.2

12-6

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Cisco Systems ONS 15600 manual 12-6

ONS 15600 specifications

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