CY7C1386DV25, CY7C1386FV25

CY7C1387DV25, CY7C1387FV25

TAP AC Switching Characteristics

Over the Operating Range [11, 12]

Parameter

Description

Min.

Max.

Unit

Clock

 

 

 

 

 

 

 

 

 

tTCYC

TCK Clock Cycle Time

50

 

ns

tTF

TCK Clock Frequency

 

20

MHz

tTH

TCK Clock HIGH time

20

 

ns

tTL

TCK Clock LOW time

20

 

ns

Output Times

 

 

 

 

tTDOV

TCK Clock LOW to TDO Valid

 

10

ns

tTDOX

TCK Clock LOW to TDO Invalid

0

 

ns

Setup Times

 

 

 

 

tTMSS

TMS Setup to TCK Clock Rise

5

 

ns

tTDIS

TDI Setup to TCK Clock Rise

5

 

ns

tCS

Capture Setup to TCK Rise

5

 

ns

Hold Times

 

 

 

 

 

 

 

 

 

tTMSH

TMS Hold after TCK Clock Rise

5

 

ns

tTDIH

TDI Hold after Clock Rise

5

 

ns

tCH

Capture Hold after Clock Rise

5

 

ns

TAP AC Test Conditions

Input pulse levels

VSS to 2.5V

Input rise and fall time

1 ns

Input timing reference levels

1.25V

Output reference levels

1.25V

Test load termination supply voltage

1.25V

TAP AC Output Load Equivalent

1.25V

50Ω

TDO

ZO= 50 Ω

 

 

 

 

 

20pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

TAP DC Electrical Characteristics And Operating Conditions (0°C < TA < +70°C; VDD = 2.5V ±0.165V unless otherwise noted) [13]

Parameter

Description

Test Conditions

Min.

Max.

Unit

VOH1

Output HIGH Voltage

IOH = –1.0 mA

1.7

 

V

VOH2

Output HIGH Voltage

IOH = –100 µA

2.1

 

V

VOL1

Output LOW Voltage

IOL = 1.0 mA

 

0.4

V

VOL2

Output LOW Voltage

IOL = 100 µA

 

0.2

V

VIH

Input HIGH Voltage

 

1.7

VDD + 0.3

V

VIL

Input LOW Voltage

 

–0.3

0.7

V

IX

Input Load Current

GND < VIN < VDDQ

–5

5

µA

Note

11.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.

12.Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1ns.

13.All voltages referenced to VSS (GND).

Document Number: 38-05548 Rev. *E

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Cypress CY7C1386DV25 TAP AC Switching Characteristics, TAP AC Test Conditions, TAP AC Output Load Equivalent, Hold Times