CY7C1386DV25, CY7C1386FV25 CY7C1387DV25, CY7C1387FV25
The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required; that is, while data captured is shifted out, the preloaded data can be shifted in.
BYPASS
When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a
EXTEST Output Bus Tri-State
IEEE Standard 1149.1 mandates that the TAP controller be able to put the output bus into a
the TAP controller, it will directly control the state of the output
This bit can be set by entering the SAMPLE/PRELOAD or EXTEST command, and then shifting the desired bit into that cell, during the
The boundary scan register has a special bit located at bit #85 (for
Reserved
These instructions are not implemented but are reserved for future use. Do not use these instructions.
TAP Timing
1 | 2 |
Test Clock |
|
(TCK) | tTH |
| |
tTMSS | tTMSH |
Test Mode Select |
|
(TMS) |
|
tTDIS | tTDIH |
Test |
|
(TDI) |
|
Test |
|
(TDO) |
|
3 | 4 | 5 | 6 |
tTL tCYC
tTDOV
tTDOX
DON’T CARE
UNDEFINED
Document Number: | Page 13 of 30 |
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