Matsushita CF-18NHHZXBM service manual Self Diagnosis Test

5 Self Diagnosis Test

Floppy disk is Included for the self-diagnostic tests that should be performed before using this product. Important notice

1.System password

If the password function has been turned on, you will need to ask the user for the password before performing the self-diagnostics.

2.FDD test

Performing the FDD test will erase the contents of the floppy disk you insert into the drive. Use a formatted disk that has no contents or whose contents are not required. This product has a password function. However, if this function is turned on, the self-diagnostics tests will not work.

5.1.Outline of Self Diagnostic Tests

Insert the diagnostics floppy disk

Return the setup contents to default

Choose test from the menu screen to start the test.

Caution:

After completing repairs, be sure to carry out the Automatic test and Peripheraltest.

Starting up the setup utility

Turn on the power.

When "Panasonic Press F2 to enter setup" appears on the screen, press F2.

Press "" to select Exit

Press " " to select Get default value

Press Enter.

Choose Yes for "Load default Configuration now?"

Select "Save Values & Exit" and press Enter.

Choose Yes for "Save Configuration changes and exit now?" and press Enter.

Menu Screen

1.DIAG on FD (CF-18 XP/2000 Model)

2.DIAG on FD (CF-18 Tablet Model)

3.LAN Test

4.Modem Test

5.Wireless LAN test (Wireless LAN Model only)

6.Button Test

Q. Quit

Select please [ 1, 2, 3, 4, 5, 6, Q ] ?

<Automatic test>	<Peripheral test>	<Test selection>
Tests selected (O) from the test	The parallel port and CD-ROM	Specifc tests required can
item list will be performed in	drive can be tested.	be freely selected and
succession.	(See 5.3 for details.)	performed from the test item
		list.

DIAG on FD

3.LAN Test

4.Modem Test

5.Wireless LAN test (Wireless LAN Model only)

6.Button Test

Be sure to carry out the Selection test only when necessary.

Problems in the unit are located and divided according to error messages that occur during testing.

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