CY7C1354C
CY7C1356C
Because the CY7C1354C and CY7C1356C are common I/O devices, data should not be driven into the device while the outputs are active. The Output Enable (OE) can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1354C and DQa,b/DQPa,b for CY7C1356C) inputs. Doing so will
Burst Write Accesses
The CY7C1354C/CY7C1356C has an
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation “sleep” mode. Two clock cycles are required to enter into or exit from this “sleep”
mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the “sleep” mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the “sleep” mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW.
Interleaved Burst Address Table (MODE = Floating or VDD)
First | Second | Third | Fourth |
Address | Address | Address | Address |
A1,A0 | A1,A0 | A1,A0 | A1,A0 |
00 | 01 | 10 | 11 |
01 | 00 | 11 | 10 |
10 | 11 | 00 | 01 |
11 | 10 | 01 | 00 |
Linear Burst Address Table (MODE = GND)
First | Second | Third | Fourth |
Address | Address | Address | Address |
A1,A0 | A1,A0 | A1,A0 | A1,A0 |
00 | 01 | 10 | 11 |
01 | 10 | 11 | 00 |
10 | 11 | 00 | 01 |
11 | 00 | 01 | 10 |
ZZ Mode Electrical Characteristics
Parameter | Description | Test Conditions | Min. | Max. | Unit |
IDDZZ | Sleep mode standby current | ZZ > VDD − 0.2V |
| 50 | mA |
tZZS | Device operation to ZZ | ZZ > VDD − 0.2V |
| 2tCYC | ns |
tZZREC | ZZ recovery time | ZZ < 0.2V | 2tCYC |
| ns |
tZZI | ZZ active to sleep current | This parameter is sampled |
| 2tCYC | ns |
tRZZI | ZZ Inactive to exit sleep current | This parameter is sampled | 0 |
| ns |
Truth Table[2, 3, 4, 5, 6, 7, 8]
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Operation | Used |
| CE |
| ZZ |
| ADV/LD |
| WE |
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| BWx |
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| OE |
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| CEN |
| CLK | DQ | |
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Deselect Cycle | None |
| H |
| L |
| L |
| X |
| X |
| X |
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| L | ||||||
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Continue Deselect Cycle | None |
| X |
| L |
| H |
| X |
| X |
| X |
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| L | ||||||
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Read Cycle (Begin Burst) | External |
| L |
| L |
| L |
| H |
| X |
| L |
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| L | Data Out (Q) | |||||
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Read Cycle (Continue Burst) | Next |
| X |
| L |
| H |
| X |
| X |
| L |
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| L | Data Out (Q) | |||||
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NOP/Dummy Read (Begin Burst) | External |
| L |
| L |
| L |
| H |
| X |
| H |
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| L | ||||||
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Dummy Read (Continue Burst) | Next |
| X |
| L |
| H |
| X |
| X |
| H |
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| L | ||||||
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Write Cycle (Begin Burst) | External |
| L |
| L |
| L |
| L |
| L |
| X |
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| L | Data In (D) | |||||
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Write Cycle (Continue Burst) | Next |
| X |
| L |
| H |
| X |
| L |
| X |
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| L | Data In (D) | |||||
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Notes:
2.X = “Don't Care”, H = Logic HIGH, L = Logic LOW, CE stands for ALL Chip Enables active. BWx = L signifies at least one Byte Write Select is active, BWx = Valid signifies that the desired Byte Write Selects are asserted, see Write Cycle Description table for details.
3.Write is defined by WE and BWX. See Write Cycle Description table for details.
4.When a write cycle is detected, all I/Os are
5.The DQ and DQP pins are controlled by the current cycle and the OE signal.
6.CEN = H inserts wait states.
7.Device will
8.OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle DQs and DQPX =
Document #: | Page 8 of 28 |
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