Cypress CY7C1480V25, CY7C1486V25, CY7C1482V25 manual Pin Definitions

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CY7C1480V25

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CY7C1482V25

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

CY7C1486V25

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin Definitions

 

 

 

 

 

 

 

 

 

 

 

Pin Name

I/O

Description

 

 

 

 

 

A0, A1, A

Input-

Address Inputs used to select one of the address locations. Sampled at the rising

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

edge of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 are sampled

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

active. A1: A0 are fed to the two-bit counter.

 

 

 

 

A,

 

 

 

B,

 

C,

Input-

Byte Write Select Inputs, active LOW. Qualified with

 

to conduct byte writes to the

 

BW

BW

BW

BWE

 

BWD, BWE, BWF,

Synchronous

SRAM. Sampled on the rising edge of CLK.

 

BWG, BWH

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK,

 

GW

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

a global write is conducted (ALL bytes are written, regardless of the values on BWX and

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

BWE).

 

 

 

 

 

 

 

 

 

 

Input-

Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal

 

BWE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

must be asserted LOW to conduct a byte write.

 

CLK

Input-

Clock Input. Captures all synchronous inputs to the device. Also increments the burst

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Clock

counter when ADV is asserted LOW during a burst operation.

 

 

1

 

 

 

Input-

Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

conjunction with CE2 and CE3 to select/deselect the device. ADSP is ignored if CE1 is

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

HIGH. CE1 is sampled only when a new external address is loaded.

 

CE2

Input-

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

conjunction with CE1 and CE3 to select/deselect the device. CE2 is sampled only when a

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

new external address is loaded.

 

 

3

 

 

 

Input-

Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in

 

CE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

conjunction with CE1 and CE2 to select/deselect the device. CE3 is sampled only when a

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

new external address is loaded.

 

 

 

 

 

 

 

Input-

Output Enable, asynchronous input, active LOW. Controls the direction of the IO pins.

 

OE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

When LOW, the IO pins behave as outputs. When deasserted HIGH, IO pins are tri-stated,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

and act as input data pins. OE is masked during the first clock of a read cycle when

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

emerging from a deselected state.

 

 

 

 

 

 

 

 

 

Input-

Advance Input signal, sampled on the rising edge of CLK, active LOW. When

 

ADV

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted, it automatically increments the address in a burst cycle.

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Processor, sampled on the rising edge of CLK, active LOW.

 

ADSP

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

When asserted LOW, addresses presented to the device are captured in the address

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

registers. A1: A0 are also loaded into the burst counter. When ADSP and ADSC are both

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

asserted, only ADSP is recognized. ASDP is ignored when CE1 is deasserted HIGH.

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Controller, sampled on the rising edge of CLK, active LOW.

 

ADSC

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

When asserted LOW, addresses presented to the device are captured in the address

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

registers. A1: A0 are also loaded into the burst counter. When ADSP and ADSC are both

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

asserted, only ADSP is recognized.

 

ZZ

Input-

ZZ “sleep” Input, active HIGH. When asserted HIGH places the device in a

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

non-time-critical “sleep” condition with data integrity preserved. For normal operation, this

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

pin has to be LOW or left floating. ZZ pin has an internal pull down.

 

DQs, DQPs

I/O-

Bidirectional Data IO lines. As inputs, they feed into an on-chip data register that is

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

triggered by the rising edge of CLK. As outputs, they deliver the data contained in the

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

memory location specified by the addresses presented during the previous clock rise of

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

the read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW,

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

the pins behave as outputs. When HIGH, DQs and DQPX are placed in a tri-state condition.

 

VDD

Power Supply

Power supply inputs to the core of the device.

 

VSS

Ground

Ground for the core of the device.

 

VSSQ[2]

I/O Ground

Ground for the I/O circuitry.

 

VDDQ

I/O Power Supply

Power supply for the I/O circuitry.

Note

2. Applicable for TQFP package. For BGA package VSS serves as ground for the core and the IO circuitry.

Document #: 38-05282 Rev. *H

Page 7 of 32

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Contents 250 MHz 200 MHz 167 MHz Unit FeaturesFunctional Description1 Selection GuideLogic Block Diagram CY7C1482V25 4M x Logic Block Diagram CY7C1480V25 2M xCLR Logic Block Diagram CY7C1486V25 1M xCY7C1480V25 2M x Pin Configurations Pin Tqfp PinoutCY7C1482V25 4M x CY7C1482V25 4M x DQP F DQP B DQ C DQ G DQ BDQ G DQ B DQP G DQP CPin Definitions TDI Single Read AccessesSingle Write Accesses Initiated by Adsp Functional OverviewLinear Burst Address Table Mode = GND Interleaved Burst Address Table Mode = Floating or VDDZZ Mode Electrical Characteristics Operation Add. Used Truth TableFunction Truth Table for Read/WriteTAP Controller Block Diagram TAP Controller State DiagramIeee 1149.1 Serial Boundary Scan Jtag TAP Instruction Set Instruction RegisterOutput Times TAP AC Switching Characteristics Over the Operating Range9TAP Timing Parameter Description Min Max Unit ClockParameter Description Test Conditions Min TAP DC Electrical Characteristics And Operating Conditions5V TAP AC Test Conditions 8V TAP AC Test ConditionsIdentification Codes Scan Register SizesBoundary Scan Exit Order 2M x M10 Boundary Scan Exit Order 4M xA11 A10 P10Boundary Scan Exit Order 1M x Range Ambient Electrical Characteristics Over the Operating Range12Maximum Ratings Operating RangeThermal Resistance14 Capacitance14AC Test Loads and Waveforms Setup Times Switching Characteristics Over the Operating Range15Parameter Description 250 MHz 200 MHz 167 MHz Unit Min Max Read Cycle Timing21 Switching WaveformsWrite Cycle Timing21 Read/Write Cycle Timing21, 23 DON’T Care ZZ Mode Timing25Ordering Information 250 Pin Thin Plastic Quad Flatpack 14 x 20 x 1.4 mm Package DiagramsBall Fbga 15 x 17 x 1.4 mm Ball Fbga 14 x 22 x 1.76 mm Document History Issue Date Orig. Description of ChangeDocument Number VKN/KKVTMP