Hitachi HTS543280L9A300 manual Device Attributes Data Structure, Data Structure Revision Number

5K320 SATA OEM Specification

S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) or automatically if the off-line read scanning feature is disabled.

A value of F8h written by the host into the device’s Sector Count register before issuing this subcommand shall cause the automatic Off-line data collection feature to be enabled.

A value of F9 written by the host into the device’s Sector Count register before issuing this subcommand shall cause the off-line read scanning feature to be enabled. The Device perform the off-line read scanning at the off -line data collection activities which is initiated by the S.M.A.R.T. Execute Off-line Immediate(Subcommand D4h) even if the automatic off-line feature is disabled.

Any other non-zero value written by the host into this register before issuing this subcommand is vender specific and will not ch ange the current Automatic Off -Line Data Collection and Off -line Read Scanning status, but device may respond with the error code specified in “Table 124 S.M.A.R.T. Error Codes” on Page 159.

14.40.2Device Attributes Data Structure

The following defines the 512 bytes that make up the Attribute Value information. This data structure is accessed by the host in its entirety using the S.M.A.R.T. Read Attribute Values subcommand. A l l multi-byte fields shown in these data structures follow the ATA/ATAPI-6 specification for byte ordering, namely that the least significant byte occupies the lowest numbered byte address location in the field.

Description	Bytes	Offset	Format	Value
Data Structure Revision Number	2	00h	binary	0010h
1st Device Attribute	12	02h	(*1)	(*2)
...	..
...	..
30th Device Attribute	12	15Eh	(*1)	(*2)
Off-line data collection status	1	16Ah	(*1)	(*2)
Self-test execution status	1	16Bh	(*1)	(*2)
Total time in seconds to complete off -line data collection activity	2	16Ch	(*1)	(*2)
Current segment pointer	1	16Eh	(*1)	(*2)
Off-line data collection capability	1	16Fh	(*1)	5Bh
S.M.A.R.T. capability	2	170h	(*1)	0003h
S.M.A.R.T. device error logging capability	1	172h	(*1)	01h
Self-test failure check point	1	173h	(*1)	(*2)
Short self-test completion time in minutes	1	174h	(*1)	(*2)
Extended self-test completion time in minutes	1	175h	(*1)	(*2)
Reserved	12	176h		(*3)
Vendor specific	125	182h		(*3)
Data structure checksum	1	1FFh	(*1)	(*2)
	512
(*1) - See following definitions
(*2) - Value varied by actual operating condition
(*3) - Filled with 00h

Table 112 Device Attribute Data Structure

14.40.2.1Data Structure Revision Number

The Data Structure Revision Number identifies which version of this data structure is implemented by the device. This revision number will be set to 0010h. This revision number identifies both the Attribute Value and Attribute Threshold Data structures.

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