5K320 SATA OEM Specification
14.40.7Selective self-test log data structure
The Selective
Description | Bytes | Offset | Read/Write |
Data structure revision | 2 | 00h | R/W |
Starting LBA for test span 1 | 8 | 02h | R/W |
Ending LBA for test span 1 | 8 | 0Ah | R/W |
Starting LBA for test span 2 | 8 | 12A | R/W |
Ending LBA for test span 2 | 8 | 1Ah | R/W |
Starting LBA for test span 3 | 8 | 22h | R/W |
Ending LBA for test span 3 | 8 | 2Ah | R/W |
Starting LBA for test span 4 | 8 | 32h | R/W |
Ending LBA for test span 4 | 8 | 3Ah | R/W |
Starting LBA for test span 5 | 8 | 42h | R/W |
Ending LBA for test span 5 | 8 | 4Ah | R/W |
Reserved | 256 | 52h | Reserved |
Vendor specific | 154 | 152h | Vendor specific |
Current LBA under test | 8 | 1ECh | Read |
Current span under test | 2 | 1F4h | Read |
Feature flags | 2 | 1F6 | R/W |
Vendor specific | 4 | 1F8h | Vendor specific |
Selective self test pending time | 2 | 1FCh | R/W |
Reserved | 1 | 1FEh | Reserved |
Data structure checksum | 1 | 1FFh | R/W |
| 512 |
|
|
Table 123 Selective self-test log data structure
14.40.8Error Reporting
The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device.
Error Condition
A S.M.A.R.T. FUNCTION SET command was received by the device without the required key being loaded into the LBA High and LBA Mid registers.
A S.M.A.R.T. FUNCTION SET command was received by the device with a subcommand value in the Features Register that is either invalid or not supported by this device.
A S.M.A.R.T. FUNCTION SET command subcommand other than S.M.A.R.T. ENABLE OPERATIONS was received by the device while the device was in a “S.M.A.R.T. disabled” state.
The device is unable to read its Attribute Values or Attribute Thresholds data structure.
The device is unable to write to its Attribute Values data structure.
Status Register 51h
51h
51h
51h
51h
Error Register 04h
04h
04h
10h or 40h
10h or 01h
Table 124 S.M.A.R.T. Error Codes
159
