Toshiba PSLD2X Subtest 06 Walking 0’s Test, Subtest 07 Address Test, Subtest 08 Refresh Test

3 Diagnostic Programs 3.6 Memory Test

The test item is to ensure that there is no short circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 06 Walking 0’s Test

The test item is to ensure that there is no open circuitry issue in memory chip. The parameter dialog window is the same as that in ‘Subtest 02 Pattern’.

Subtest 07 Address Test

This test item is to check short and open issue on memory address lines.

Subtest 08 Refresh Test

This test item is to check whether the memory refresh works normally. The parameter dialog window is as follows:

Subtest 09 Cache Memory

The test item is to check whether the CPU internal cache memory could be accessed correctly.

Subtest 10 Random Memory

Random Memory test includes the following two test items: Randomize Test and Random Incremental Read/Write Test. The parameter dialog window is the same as that in ‘Subtest 03 Extended Pattern’.

1. Randomize Test

This test item is to check whether the memory could be correctly accessed with randomized data and randomized memory address.

2. Random Increment Read/Write

This test item is to check whether the memory could be correctly accessed with randomized memory address and a series of incremental data.

Subtest 11 Data Bus Test

38Satellite L350,Satellite Pro L350, EQUIUM L350,SATEGO L350 Maintenance Manual