Cypress CY7C1320CV18-250BZC, 001-07160 manual Features, Functional Description, Configurations

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CY7C1318CV18

CY7C1320CV18

18-Mbit DDR II SRAM 2-Word Burst Architecture

Features

18-Mbit Density (1M x 18, 512K x 36)

267 MHz Clock for high Bandwidth

2-word Burst for reducing Address Bus Frequency

Double Data Rate (DDR) Interfaces (data transferred at 534 MHz) at 267 MHz

Two Input Clocks (K and K) for precise DDR Timing SRAM uses rising edges only

Two Input Clocks for Output Data (C and C) to minimize Clock Skew and Flight Time mismatches

Echo Clocks (CQ and CQ) simplify Data Capture in High Speed Systems

Synchronous internally Self-timed Writes

DDR II operates with 1.5 Cycle Read Latency when the DLL is enabled

Operates similar to a DDR I Device with one Cycle Read Latency in DLL Off Mode

1.8V Core Power Supply with HSTL Inputs and Outputs

Variable drive HSTL Output Buffers

Expanded HSTL Output Voltage (1.4V–VDD)

Available in 165-Ball FBGA Package (13 x 15 x 1.4 mm)

Offered in both Pb-free and non Pb-free Packages

JTAG 1149.1 compatible Test Access Port

Delay Lock Loop (DLL) for accurate Data Placement

Functional Description

The CY7C1318CV18, and CY7C1320CV18 are 1.8V Synchronous Pipelined SRAMs equipped with DDR II archi- tecture. The DDR II consists of an SRAM core with advanced synchronous peripheral circuitry and a one-bit burst counter. Addresses for read and write are latched on alternate rising edges of the input (K) clock. Write data is registered on the rising edges of both K and K. Read data is driven on the rising edges of C and C if provided, or on the rising edge of K and K if C/C are not provided. For CY7C1318CV18 and CY7C1320CV18, the burst counter takes in the least significant bit of the external address and bursts two 18-bit words (in the case of CY7C1318CV18) of two 36-bit words (in the case of CY7C1320CV18) sequentially into or out of the device.

Asynchronous inputs include an output impedance matching input (ZQ). Synchronous data outputs (Q, sharing the same physical pins as the data inputs, D) are tightly matched to the two output echo clocks CQ/CQ, eliminating the need to capture data separately from each individual DDR SRAM in the system design. Output data clocks (C/C) enable maximum system clocking and data synchronization flexibility.

All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the C or C (or K or K in a single clock domain) input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry.

Configurations

CY7C1318CV18 – 1M x 18

CY7C1320CV18 – 512K x 36

Selection Guide

Description

 

267 MHz

250 MHz

200 MHz

167 MHz

Unit

Maximum Operating Frequency

 

267

250

200

167

MHz

 

 

 

 

 

 

 

Maximum Operating Current

x18

805

730

600

510

mA

 

 

 

 

 

 

 

 

x36

855

775

635

540

 

 

 

 

 

 

 

 

Cypress Semiconductor Corporation • 198 Champion Court

San Jose, CA 95134-1709

408-943-2600

Document Number: 001-07160 Rev. *F

 

Revised August 24, 2009

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Contents Configurations FeaturesFunctional Description Selection GuideLogic Block Diagram CY7C1320CV18 Logic Block Diagram CY7C1318CV18Ball Fbga 13 x 15 x 1.4 mm Pinout Pin ConfigurationCY7C1318CV18 1M x CY7C1320CV18 512K xPin Name Pin Description Pin DefinitionsSynchronous Read/Write Input. When Referenced with Respect toPower Supply Inputs for the Outputs of the Device Power Supply Inputs to the Core of the DeviceTDO for Jtag TCK Pin for JtagFunctional Overview Programmable Impedance Application ExampleEcho Clocks SRAM#1 ZQOperation Write Cycle DescriptionsFirst Address External Second Address Internal CommentsDevice Write cycle description table for CY7C1320CV18 follows.2Into the device. D359 remains unaltered Device. D80 and D3518 remains unalteredIeee 1149.1 Serial Boundary Scan Jtag Idcode State diagram for the TAP controller follows.9 TAP Controller State DiagramTAP Electrical Characteristics TAP Controller Block DiagramTAP Timing and Test Conditions TAP AC Switching CharacteristicsScan Register Sizes Identification Register DefinitionsInstruction Codes Register Name Bit SizeBit # Bump ID Boundary Scan OrderPower Up Sequence Power Up Sequence in DDR II SramDLL Constraints Electrical Characteristics Neutron Soft Error ImmunityDC Electrical Characteristics Maximum RatingsCapacitance AC Electrical CharacteristicsThermal Resistance Parameter Description Test Conditions Max UnitParameter Min Max DLL Timing Parameter Min Max Output TimesRead/Write/Deselect Sequence26, 27 Switching WaveformsCY7C1320CV18-267BZXC Ordering InformationCY7C1320CV18-167BZC Document Number 001-07160 Rev. *F Ball Fbga 13 x 15 x 1.4 mm Package DiagramDocument History Worldwide Sales and Design Support Products Sales, Solutions, and Legal Information