CY7C1266V18, CY7C1277V18
CY7C1268V18, CY7C1270V18
TAP AC Switching Characteristics
Over the Operating Range[13, 14]
Parameter | Description | Min | Max | Unit |
tTCYC | TCK Clock Cycle Time | 50 |
| ns |
tTF | TCK Clock Frequency |
| 20 | MHz |
tTH | TCK Clock HIGH | 20 |
| ns |
tTL | TCK Clock LOW | 20 |
| ns |
Setup Times |
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tTMSS | TMS Setup to TCK Clock Rise | 5 |
| ns |
tTDIS | TDI Setup to TCK Clock Rise | 5 |
| ns |
tCS | Capture Setup to TCK Rise | 5 |
| ns |
Hold Times |
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tTMSH | TMS Hold after TCK Clock Rise | 5 |
| ns |
tTDIH | TDI Hold after Clock Rise | 5 |
| ns |
tCH | Capture Hold after Clock Rise | 5 |
| ns |
Output Times |
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tTDOV | TCK Clock LOW to TDO Valid |
| 10 | ns |
tTDOX | TCK Clock LOW to TDO Invalid | 0 |
| ns |
TAP Timing and Test Conditions
Figure 2 shows the TAP timing and test conditions.[14]
Figure 2. TAP Timing and Test Conditions
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TDO |
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Z0 | = 50Ω |
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(a) GND
Test Clock
TCK
tTMSS
0V
tTH
ALL INPUT PULSES
1.8V
0.9V
tTL
tTCYC
tTMSH
Test Mode Select
TMS
Test Data In
TDI
Test Data Out
TDO
tTDIS | tTDIH |
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tTDOV |
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Notes
13.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.
14.Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.
Document Number: | Page 16 of 27 |
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