HP 1GSa/s Digitizing Oscilloscope 16532A manual HP 16532A Oscilloscope Block Diagram

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HP 16532A - Service

Figure 6-1. HP 16532A Oscilloscope Block Diagram

phase detector provide the sample clock for higher sample rates. After conditioning and sampling, the signals are digitized, then stored in a hybrid IC containing a FISO (fast in, slow out) memory.

ADC. The eight-bit ADC digitizes the channel signal. Digitization is done by comparators in a flash converter. The sample clock latches the digitized value of the input to save it so that it can be sent to memory.

FISO Memory. 8000 samples of the FISO (fast in, slow out) memory are used per measurement per channel. Memory positions are not addressed directly. The configuration is a ring which loops continuously as it is clocked. Memory position is tracked by counting clocks. The clocking rate is the same as the ADC, however the clock frequency is half that of the ADC since the FISO clocks on both transitions of the clock period. Data is buffered onto the CPU data bus for processing.

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Contents HP 16532A Safety Considerations Safety SymbolsContents Section Replaceable Parts ServiceCalibration List of Tables Page Table of Contents Page Module Covered by This Manual Safety RequirementsIntroduction Accessories Supplied Accessories AvailableSpecifications Operating CharacteristicsHP 16532A Specifications Rise Time2 1.4 nsWaveform Record Length 8000 points Vertical dc Gain Accuracy4 ± 1.5% of full scaleTimebase HP 16532A Operating CharacteristicsVertical at BNC Triggering DigitizerTrigger Level Range Trigger ModesWaveform Display Display ModesMeasurement Aids Setup Aids Operating EnvironmentEquipment Critical Specifications Recommended Model USE Page Table of Contents Page Power Requirements Initial Inspection Safety RequirementsModule Installation Preparation for UseInstallation Considerations ProcedureEndplate Overlap Bottom Sequence Tagging for Service Operating EnvironmentStorage PackagingTable of Contents Page Performance Test Interval Performance Test ProceduresTest Record DC CAL Output Test AC CAL Output Test Input Resistance SpecificationEquipment Required Critical Specification Model/Part Number Page Voltage Measurement Accuracy Voltage Measurement Accuracy Test Div Offset Supply Upper Limit Lower Limit Procedure Zero-Input Offset Offset AccuracyDC Input Offset Div Offset Supply Min MaxBandwidth V1MHz Time Measurement Accuracy Menu Selection Setting Trigger Sensitivity RUN Repetitive Performance Test Record Paragraph No Test Results Yes No Page Table of Contents Page Maintaining System Integrity Calibration Protection SwitchCalibration Interval Instrument Warmup CalibrationSetting the PROTECT/UNPROTECT Switch to Unprotect Location of the PROTECT/UNPROTECT SwitchLoading the Default Calibration Factors Equipment Required for CalibrationCalibrate Vert Cal of the Self Cal menu as follows Calibrate Delay of the Self Cal menu as followsSelf Cal Menu Calibrations Calibrate the Time Null of the Self Cal menu as follows Calibrate the Logic Trigger of the Self Cal menu as followsCalibrate the Ext Trig Null of the Self Cal menu as follows Ext Trig Null Calibration ConnectionsSetting the PROTECT/UNPROTECT Switch to Protect Sealing the MainframeTable of Contents Page Replaceable Parts List AbbreviationsOrdering Information Exchange AssembliesDirect Mail Order System Reference Designator and Abbreviations Parts Identification Reference Designator HP Part Qty NumberDescription Mfr Code Mfr Part NumberPage Table of Contents Page Introduction Safety Requirements Module Block Diagram and The- ory of OperationMain Assembly Theory of Operation Attenuator Theory of OperationHP 16532A Oscilloscope Block Diagram Page Self-Test Access Procedure Self-TestsLoad Test System Screen Functional Tests Screen Touch the Functional Tests fieldA/D Test Run Screen Exit Test System Screen Self-Test Descriptions Data Memory TestTimebase Test TestTroubleshooting Troubleshooting AidsVerifying the System Clock Page 1 6 5 3 2 a Troubleshooting E E TTroubleshooting Sheet Troubleshooting E E T Troubleshooting E E T Troubleshooting E E T Troubleshooting E E T Oscilloscope Module Removal and Replacement Oscilloscope Module Removal ProcedureOscilloscope Module Replacement Procedure 12. Endplate Overlap Bottom SequenceTrigger Cable Removal and Replacement Trigger Cable Removal ProcedureAttenuator Removal Procedure Attenuator Removal and ReplacementTrigger Cable Replacement Procedure Attenuator Replacement Procedure Assistance WarrantyCertification