HP 16532A - Service
Self-Test Descriptions
The following
Data Memory Test
This test verifies the correct operation of the FISO
Timebase Test
The
A/D Test
This test verifies the correct operation of the A/D convertor on each board. A check of the trigger in Trigger Immediate mode is first made. The A/D convertors are then exercised by setting the reference voltage and channel offset such that a simulated acquisition obtains data in the extremes and middle of the quantization range of the A/D convertor. After each simulated acquisition, the data is compared with known values.
D/A Test
This test verifies the correct operation of the D/A convertor on each board. Both the offset and trigger level D/A convertors for each channel are set to a reference level and then changed. The logic trigger IC is programmed to detect the changes. The detection of a correct trigger indicates that the D/A convertor is operating normally.
Trigger Test
This test verifies the correct operation of the trigger components on each board. First, the logic trigger memory is checked by writing and then reading known patterns. The logic qualifiers, logic trigger output, and trigger holdoff are checked.
IMB Test
This test verifies the correct operation of the oscilloscope card interface to the intermodule bus.
All Tests
This will automatically execute each test, one at a time, until all tests are done.