PRELIMINARY

CY14B101P

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Retention and Endurance

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

 

Description

Min

Unit

DATAR

Data Retention

 

 

20

Years

NVC

Nonvolatile STORE Operations

200

K

Capacitance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter[6]

Description

 

Test Conditions

Max

Unit

CIN

Input Capacitance

 

TA = 25°C, f = 1MHz,

6

pF

 

 

 

VCC = 3.0V

 

 

COUT

Output Pin Capacitance

 

8

pF

Thermal Resistance

 

 

 

 

 

 

 

 

 

 

 

Parameter[6]

Description

 

Test Conditions

16-SOIC

Unit

ΘJA

Thermal Resistance

 

Test conditions follow standard test methods

TBD

°C/W

 

(Junction to Ambient)

 

and procedures for measuring thermal

 

 

 

 

 

 

impedance, per EIA / JESD51.

 

 

ΘJC

Thermal Resistance

 

TBD

°C/W

 

(Junction to Case)

 

 

 

 

 

 

Figure 24. AC Test Loads and Waveforms

3.0V

577Ω

3.0V

 

R1

OUTPUT

OUTPUT

30 pF

 

 

 

 

 

 

 

 

 

 

 

 

R2

5 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

789Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

577Ω

R1

R2 789Ω

AC Test Conditions

Input Pulse Levels

0V to 3V

Input Rise and Fall Times (10% - 90%)

<3 ns

Input and Output Timing Reference Levels

1.5V

Note

6. These parameters are guaranteed by design and are not tested.

Document #: 001-44109 Rev. *B

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Cypress CY14B101P manual Data Retention and Endurance, Capacitance, Thermal Resistance, AC Test Conditions, Soic