CY7C1471V25
CY7C1473V25
CY7C1475V25
Switching Characteristics
Over the Operating Range. Timing reference level is 1.25V when VDDQ = 2.5V and is 0.9V when VDDQ = 1.8V. Test conditions shown in (a) of “AC Test Loads and Waveforms” on page 22 unless otherwise noted.
Parameter |
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| Description | 133 MHz | 100 MHz | Unit | ||
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| Min | Max | Min | Max | |||
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tPOWER |
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| 1 |
| 1 |
| ms |
Clock |
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tCYC |
| Clock Cycle Time | 7.5 |
| 10 |
| ns | |||||||
tCH |
| Clock HIGH | 2.5 |
| 3.0 |
| ns | |||||||
tCL |
| Clock LOW | 2.5 |
| 3.0 |
| ns | |||||||
Output Times |
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tCDV |
| Data Output Valid After CLK Rise |
| 6.5 |
| 8.5 | ns | |||||||
tDOH |
| Data Output Hold After CLK Rise | 2.5 |
| 2.5 |
| ns | |||||||
t |
| Clock to | 3.0 |
| 3.0 |
| ns | |||||||
CLZ |
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t |
| Clock to |
| 3.8 |
| 4.5 | ns | |||||||
CHZ |
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tOEV |
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| LOW to Output Valid |
| 3.0 |
| 3.8 | ns | |||||
OE |
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t |
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| LOW to Output | 0 |
| 0 |
| ns | |||||
OE |
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OELZ |
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t |
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| HIGH to Output |
| 3.0 |
| 4.0 | ns | |||||
OE |
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OEHZ |
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Setup Times |
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tAS |
| Address Setup Before CLK Rise | 1.5 |
| 1.5 |
| ns | |||||||
tALS |
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ADV/LD |
| Setup Before CLK Rise | 1.5 |
| 1.5 |
| ns | |||||||
tWES |
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| X Setup Before CLK Rise | 1.5 |
| 1.5 |
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WE, | BW |
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tCENS |
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| Setup Before CLK Rise | 1.5 |
| 1.5 |
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CEN |
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tDS |
| Data Input Setup Before CLK Rise | 1.5 |
| 1.5 |
| ns | |||||||
tCES |
| Chip Enable Setup Before CLK Rise | 1.5 |
| 1.5 |
| ns | |||||||
Hold Times |
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tAH |
| Address Hold After CLK Rise | 0.5 |
| 0.5 |
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tALH |
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ADV/LD | Hold After CLK Rise | 0.5 |
| 0.5 |
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tWEH |
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| X Hold After CLK Rise | 0.5 |
| 0.5 |
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WE, | BW |
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tCENH |
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| Hold After CLK Rise | 0.5 |
| 0.5 |
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CEN |
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tDH |
| Data Input Hold After CLK Rise | 0.5 |
| 0.5 |
| ns | |||||||
tCEH |
| Chip Enable Hold After CLK Rise | 0.5 |
| 0.5 |
| ns |
Notes
15.This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially, before a read or write operation can be initiated.
16.tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of “AC Test Loads and Waveforms” on page 22. Transition is measured ±200 mV from
17.At any supplied voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve
18.This parameter is sampled and not 100% tested.
Document #: | Page 23 of 32 |
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