Keyboard
4.3.6.5KEYBOARD_TEST_MODES
This configuration definition is used to selectively compile code for keyboard test modes. If this value is defined, then test modes are compiled into the executable image. If it is not defined, then the test mode code is omitted. The test modes are described in section Test Module on page 62.
4.3.6.6KEYBOARD_TEST_MODE_PERIOD
This configuration value sets the period that the keyboard generates on test key presses. A key press consists of a scan code as the down key and a NULL as the up key. The default value is 10 ms.
4.3.6.7PANGRAM_TEST_MODE
This configuration definition is used to selectively compile in the pangram test mode. A pangram is a sentence that contains all of the letters of the alphabet at least once.
4.3.6.8KEYBOARD_BATTERY_VOLTAGE_SUPPORT
This configuration definition is used to selectively compile support for battery voltage level reporting. If this value is defined, then battery voltage level reporting is compiled into the executable image. If it is not defined, then the battery voltage level reporting code is omitted.
4.3.6.9LP_RDK_KEYBOARD_MATRIX
This configuration definition is used to selectively compile in the keyboard matrix for the RDK key- board hardware.
4.3.6.10KEYBOARD_TX_TIMEOUT
This configuration value sets the maximum time that the keyboard tries to send a report to the bridge. The default value is 5000 ms.
4.3.6.11TIMER_CAL
This configuration definition is used to selectively compile in the
4.3.6.12ENCRYPT_TEA
This configuration definition is used to selectively compile in TEA encryption for the keyboard. Con- tact Cypress Applications support for the encryption source code.
4.3.6.13ENCRYPT_AES
This configuration definition is used to selectively compile in AES encryption for the keyboard. Con- tact Cypress Applications support for the encryption source code.
4.3.6.14MFG_TEST_CODE
This configuration definition is used to selectively compile in the manufacturing test code. The man- ufacturing test code in this keyboard is compatible with the CY3631 Manufacturing Test Kit offered by Cypress Semiconductor. See the mfgtest module for a description of how this test mode is exe- cuted. See the CY3631 Manufacturing Test Kit documentation for a description of the test operation.
4.3.6.15MFG_ENTER_BY_PIN
This configuration definition is used to select whether the manufacturing test code is executed by connecting pin 4 and 5 on the ISP (programming) header. When this value is not defined, then the
64 | CY4672 Reference Design Guide, Document # |
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